FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHONOLY

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Guangdong, CN

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Prognostic circuit of electromigration failure for integrated circuit
- Patent number 9,329,228
- Issue date May 3, 2016
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Yiqiang Chen
- G01 - MEASURING TESTING

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