Focus-eBeam Technology (Beijing) Co., Ltd.

Organization

Beijing, CN

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Microscope
- Patent number 11,798,781
- Issue date Oct 24, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging system and method for specimen detection
- Patent number 11,598,732
- Issue date Mar 7, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 11,508,548
- Issue date Nov 22, 2022
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Sha Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope with composite detection system and sp...
- Patent number 11,145,487
- Issue date Oct 12, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope objective lens system and method for s...
- Patent number 11,075,056
- Issue date Jul 27, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic lens and exciting current control method
- Patent number 10,923,312
- Issue date Feb 16, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum condition processing apparatus, system and method for specim...
- Patent number 10,903,039
- Issue date Jan 26, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system, opto-electro simultaneous detection s...
- Patent number 10,879,036
- Issue date Dec 29, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G02 - OPTICS
Information Patent Grant
Low voltage scanning electron microscope and method for specimen ob...
- Patent number 10,777,382
- Issue date Sep 15, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum condition controlling apparatus, system and method for speci...
- Patent number 10,699,874
- Issue date Jun 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM SYSTEM
- Publication number 20230317404
- Publication date Oct 5, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20230028903
- Publication date Jan 26, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPE
- Publication number 20220108870
- Publication date Apr 7, 2022
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20210391142
- Publication date Dec 16, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Sha LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING SYSTEM AND METHOD FOR SPECIMEN DETECTION
- Publication number 20210231589
- Publication date Jul 29, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei HE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE OBJECTIVE LENS SYSTEM AND METHOD FOR S...
- Publication number 20210110994
- Publication date Apr 15, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE WITH COMPOSITE DETECTION SYSTEM AND SP...
- Publication number 20210066031
- Publication date Mar 4, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW VOLTAGE SCANNING ELECTRON MICROSCOPE AND METHOD FOR SPECIMEN OB...
- Publication number 20200234914
- Publication date Jul 23, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM CONDITION PROCESSING APPARATUS, SYSTEM AND METHOD FOR SPECIM...
- Publication number 20200035443
- Publication date Jan 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...
- Publication number 20200035448
- Publication date Jan 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC LENS AND EXCITING CURRENT CONTROL METHOD
- Publication number 20190295808
- Publication date Sep 26, 2019
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, OPTO-ELECTRO SIMULTANEOUS DETECTION S...
- Publication number 20190287760
- Publication date Sep 19, 2019
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS

Focus-eBeam Technology (Beijing) Co., Ltd.

Organization

Patents Grantslast 30 patents

Microscope

Imaging system and method for specimen detection

Scanning electron microscope

Scanning electron microscope with composite detection system and sp...

Scanning electron microscope objective lens system and method for s...

Magnetic lens and exciting current control method

Vacuum condition processing apparatus, system and method for specim...

Charged particle beam system, opto-electro simultaneous detection s...

Low voltage scanning electron microscope and method for specimen ob...

Vacuum condition controlling apparatus, system and method for speci...

Patents Applicationslast 30 patents

ELECTRON BEAM SYSTEM

ELECTRON MICROSCOPE

MICROSCOPE

SCANNING ELECTRON MICROSCOPE

IMAGING SYSTEM AND METHOD FOR SPECIMEN DETECTION

SCANNING ELECTRON MICROSCOPE OBJECTIVE LENS SYSTEM AND METHOD FOR S...

SCANNING ELECTRON MICROSCOPE WITH COMPOSITE DETECTION SYSTEM AND SP...

LOW VOLTAGE SCANNING ELECTRON MICROSCOPE AND METHOD FOR SPECIMEN OB...

VACUUM CONDITION PROCESSING APPARATUS, SYSTEM AND METHOD FOR SPECIM...

VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...

MAGNETIC LENS AND EXCITING CURRENT CONTROL METHOD

CHARGED PARTICLE BEAM SYSTEM, OPTO-ELECTRO SIMULTANEOUS DETECTION S...

Trademarklast 30 trademarks