GATAN, INC

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PITTSBURGH, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Electron energy loss spectrometer using direct detection sensor
- Patent number 10,535,492
- Issue date Jan 14, 2020
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid energy conversion and processing detector
- Patent number 10,215,865
- Issue date Feb 26, 2019
- Gatan, Inc.
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Electron energy loss spectrometer
- Patent number 9,966,219
- Issue date May 8, 2018
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy loss spectrometer using direct detection sensor
- Patent number 9,966,220
- Issue date May 8, 2018
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid energy conversion and processing detector
- Patent number 9,696,435
- Issue date Jul 4, 2017
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for image outlier removal for transmission electron microsco...
- Patent number 9,415,095
- Issue date Aug 16, 2016
- Gatan, Inc.
- Paul Mooney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for normalizing multi-gain images
- Patent number 8,577,171
- Issue date Nov 5, 2013
- Gatan, Inc.
- William Mollon
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for real-time removal of vertical scan streaks in a CCD
- Patent number 8,542,300
- Issue date Sep 24, 2013
- Gatan, Inc.
- Paul Mooney
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Microtome utilizing a movable knife in a retardation field scanning...
- Patent number 8,476,585
- Issue date Jul 2, 2013
- Gatan, Inc.
- Simon Andrew Galloway
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated backscattered electron detector with cathodoluminescence...
- Patent number 8,410,443
- Issue date Apr 2, 2013
- Gatan, Inc.
- David J. Stowe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for creating reference images in electron microscopes
- Patent number 8,320,704
- Issue date Nov 27, 2012
- Gatan, Inc.
- Paul E. Mooney
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for discrimination of backscattered from incoming electrons...
- Patent number 8,129,679
- Issue date Mar 6, 2012
- Gatan, Inc.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retractable lens-coupled electron microscope camera with image sens...
- Patent number 7,964,846
- Issue date Jun 21, 2011
- Gatan, Inc.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder with integral ion beam screen and in situ adjustment
- Patent number 7,700,917
- Issue date Apr 20, 2010
- Gatan, Inc.
- Simon Galloway
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Condenser zone plate illumination for point X-ray sources
- Patent number 7,466,796
- Issue date Dec 16, 2008
- Gatan, Inc.
- Scott H. Bloom
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiation-resistant zone plates and method of manufacturing thereof
- Patent number 7,452,820
- Issue date Nov 18, 2008
- Gatan, Inc.
- Scott H. Bloom
- G02 - OPTICS
Information Patent Grant
Rotating shutter for laser-produced plasma debris mitigation
- Patent number 7,302,043
- Issue date Nov 27, 2007
- Gatan, Inc.
- Scott H. Bloom
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Energy selecting slit and energy selective sample analysis systems...
- Patent number 7,238,938
- Issue date Jul 3, 2007
- Gatan, Inc.
- Colin Geoffrey Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen elevator for an ion milling machine
- Patent number 4,272,682
- Issue date Jun 9, 1981
- Gatan, Inc.
- Peter R. Swann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20170207058
- Publication date Jul 20, 2017
- GATAN, INC.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR
- Publication number 20170207059
- Publication date Jul 20, 2017
- GATAN, INC.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Image Outlier Removal for Transmission Electron Microsco...
- Publication number 20150332892
- Publication date Nov 19, 2015
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID ENERGY CONVERSION AND PROCESSING DETECTOR
- Publication number 20150301196
- Publication date Oct 22, 2015
- GATAN, INC.
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED P...
- Publication number 20140027632
- Publication date Jan 30, 2014
- GATAN, INC.
- David Stowe
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR COLLECTION OF CATHODOLUMINESCENCE SIGNALS
- Publication number 20130141803
- Publication date Jun 6, 2013
- GATAN, INC.
- Simon Galloway
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOL...
- Publication number 20130140459
- Publication date Jun 6, 2013
- GATAN, INC.
- Simon Galloway
- G01 - MEASURING TESTING
Information Patent Application
Integrated Backscattered Electron Detector with Cathodoluminescence...
- Publication number 20130099116
- Publication date Apr 25, 2013
- GATAN, INC.
- David J. Stowe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COOLED MANIPULATOR TIP FOR REMOVAL OF FROZEN MATERIAL
- Publication number 20120286175
- Publication date Nov 15, 2012
- GATAN, INC.
- Andrew Nicholas Searle
- G02 - OPTICS
Information Patent Application
MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING...
- Publication number 20120223228
- Publication date Sep 6, 2012
- GATAN, INC.
- Simon Galloway
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR DISCRIMINATION OF BACKSCATTERED FROM INCOMING ELECTRONS...
- Publication number 20100327161
- Publication date Dec 30, 2010
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ELECTRON BACK-ILLUMINATION OF A SEMICONDUCTOR IMAGE SENSOR
- Publication number 20100123082
- Publication date May 20, 2010
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PASSIVE PIXEL DIRECT DETECTION SENSOR
- Publication number 20100123077
- Publication date May 20, 2010
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RETRACTABLE LENS-COUPLED ELECTRON MICROSCOPE CAMERA WITH IMAGE SENS...
- Publication number 20100032576
- Publication date Feb 11, 2010
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REAL-TIME REMOVAL OF VERTICAL SCAN STREAKS IN A CCD
- Publication number 20100033605
- Publication date Feb 11, 2010
- GATAN, INC.
- Paul Mooney
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR CREATING REFERENCE IMAGES IN ELECTRON MICROSCOPES
- Publication number 20090080799
- Publication date Mar 26, 2009
- GATAN, INC.
- Paul E. Mooney
- G06 - COMPUTING CALCULATING COUNTING

Organization

Patents Grantslast 30 patents

Electron energy loss spectrometer using direct detection sensor

Hybrid energy conversion and processing detector

Electron energy loss spectrometer

Electron energy loss spectrometer using direct detection sensor

Hybrid energy conversion and processing detector

Method for image outlier removal for transmission electron microsco...

Method for normalizing multi-gain images

Method for real-time removal of vertical scan streaks in a CCD

Microtome utilizing a movable knife in a retardation field scanning...

Integrated backscattered electron detector with cathodoluminescence...

Method for creating reference images in electron microscopes

Method for discrimination of backscattered from incoming electrons...

Retractable lens-coupled electron microscope camera with image sens...

Specimen holder with integral ion beam screen and in situ adjustment

Condenser zone plate illumination for point X-ray sources

Radiation-resistant zone plates and method of manufacturing thereof

Rotating shutter for laser-produced plasma debris mitigation

Energy selecting slit and energy selective sample analysis systems...

Specimen elevator for an ion milling machine

Patents Applicationslast 30 patents

ELECTRON ENERGY LOSS SPECTROMETER

ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR

Method for Image Outlier Removal for Transmission Electron Microsco...

HYBRID ENERGY CONVERSION AND PROCESSING DETECTOR

SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED P...

APPARATUS FOR COLLECTION OF CATHODOLUMINESCENCE SIGNALS

SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOL...

Integrated Backscattered Electron Detector with Cathodoluminescence...

COOLED MANIPULATOR TIP FOR REMOVAL OF FROZEN MATERIAL

MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING...

METHOD FOR DISCRIMINATION OF BACKSCATTERED FROM INCOMING ELECTRONS...

METHOD FOR ELECTRON BACK-ILLUMINATION OF A SEMICONDUCTOR IMAGE SENSOR

PASSIVE PIXEL DIRECT DETECTION SENSOR

RETRACTABLE LENS-COUPLED ELECTRON MICROSCOPE CAMERA WITH IMAGE SENS...

METHOD FOR REAL-TIME REMOVAL OF VERTICAL SCAN STREAKS IN A CCD

METHOD FOR CREATING REFERENCE IMAGES IN ELECTRON MICROSCOPES

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