Giga Probe, Inc.

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Patents Grantslast 30 patents

Information Patent Grant
Multi-point probe assembly for testing electronic device
- Patent number 5,355,080
- Issue date Oct 11, 1994
- Giga Probe, Inc.
- Kaoru Sato
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point probe assembly for testing electronic device
- Patent number 5,214,375
- Issue date May 25, 1993
- Giga Probe, Inc.
- Harunobu Ikeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point probe assembly for testing electronic device
- Patent number 5,084,672
- Issue date Jan 28, 1992
- Giga Probe, Inc.
- Harunobu Ikeuchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

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