GII Acquisition, LLC dba General Inspection, LLC

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Davisburg, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Profile inspection system for threaded and axial components
- Patent number 11,199,395
- Issue date Dec 14, 2021
- GII Acquisition, LLC
- David Crowther
- G05 - CONTROLLING REGULATING
Information Patent Grant
Profile inspection system for threaded and axial components
- Patent number 10,690,487
- Issue date Jun 23, 2020
- GII Acquisition LLC
- David Crowther
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for optically inspecting headed manufactured parts
- Patent number 10,094,785
- Issue date Oct 9, 2018
- GII Acquisition, LLC
- Robert Joseph Offenborn
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optically inspecting headed manufactured parts
- Patent number 10,088,431
- Issue date Oct 2, 2018
- GII Acquisition, LLC
- Robert Joseph Offenborn
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and system for optically inspecting parts
- Patent number 9,697,596
- Issue date Jul 4, 2017
- GII Acquisition, LLC
- Michael G. Nygaard
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Non-contact method and system for inspecting a manufactured part at...
- Patent number 9,575,013
- Issue date Feb 21, 2017
- GII Acquisition, LLC
- Michael G. Nygaard
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
High speed method and system for inspecting a stream of parts at a...
- Patent number 9,539,619
- Issue date Jan 10, 2017
- GII Acquisition, LLC
- Nathan Andrew-Paul Kujacznski
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
High-speed, triangulation-based, 3-D method and system for inspecti...
- Patent number 9,486,840
- Issue date Nov 8, 2016
- GII Acquisition, LLC
- Michael G. Nygaard
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
High-resolution imaging and processing method and system for increa...
- Patent number 9,377,297
- Issue date Jun 28, 2016
- GII Acquisition, LLC
- Christopher C. Fleming
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optically inspecting a manufactured part at a...
- Patent number 9,370,799
- Issue date Jun 21, 2016
- GII Acquisition, LLC
- Michael G. Nygaard
- F42 - AMMUNITION BLASTING
Information Patent Grant
Method and system for optically inspecting the ends of a manufactur...
- Patent number 9,372,160
- Issue date Jun 21, 2016
- GII Acquisition, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
High speed method and system for inspecting a stream of parts
- Patent number 9,228,957
- Issue date Jan 5, 2016
- GII Acquisition, LLC
- Nathan Andrew-Paul Kujacznski
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and system for optically inspecting parts
- Patent number 9,019,489
- Issue date Apr 28, 2015
- GII Acquisition, LLC
- Michael G. Nygaard
- F42 - AMMUNITION BLASTING
Information Patent Grant
High-speed, high-resolution, triangulation-based, 3-D method and sy...
- Patent number 8,993,914
- Issue date Mar 31, 2015
- GII Acquisition, LLC
- Nathan Andrew-Paul Kujacznski
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
High-speed, 3-D method and system for optically measuring a geometr...
- Patent number 8,896,844
- Issue date Nov 25, 2014
- GII Acquisition, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optically inspecting parts
- Patent number 8,570,504
- Issue date Oct 29, 2013
- GII Acquisition, LLC
- Michael G. Nygaard
- F42 - AMMUNITION BLASTING
Information Patent Grant
Method and system for centering and aligning manufactured parts of...
- Patent number 8,550,444
- Issue date Oct 8, 2013
- GII Acquisition, LLC
- Gregory M. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optically inspecting parts
- Patent number 8,390,826
- Issue date Mar 5, 2013
- GII Acquisition, LLC
- Eric M. Walstra
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automatically inspecting parts and for automa...
- Patent number 8,237,935
- Issue date Aug 7, 2012
- GII Acquisition, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for quickly retaining and releasing parts to be optically...
- Patent number 8,132,802
- Issue date Mar 13, 2012
- GII Acquisition, LLC
- Kenneth S. Kolodge
- G01 - MEASURING TESTING
Information Patent Grant
Calibration device for use in an optical part measuring system
- Patent number 8,013,990
- Issue date Sep 6, 2011
- GII Acquisition, LLC
- John D. Spalding
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method and system for inspecting parts
- Patent number 7,920,278
- Issue date Apr 5, 2011
- GII Acquisition, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Optical method and system for generating calibration data for use i...
- Patent number 7,907,267
- Issue date Mar 15, 2011
- GII Acquisition, LLC
- John D. Spalding
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting parts utilizing triangulation
- Patent number 7,812,970
- Issue date Oct 12, 2010
- GII Acquisition, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Method for precisely measuring position of a part to be inspected a...
- Patent number 7,796,278
- Issue date Sep 14, 2010
- GII Acquisition, LLC
- John D. Spalding
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optically inspecting parts
- Patent number 7,777,900
- Issue date Aug 17, 2010
- GII Acquisition, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Calibration device for use in an optical part measuring system
- Patent number 7,755,754
- Issue date Jul 13, 2010
- GII Acquisition, LLC
- John D. Spalding
- G01 - MEASURING TESTING
Information Patent Grant
Method and inspection head apparatus for optically measuring geomet...
- Patent number 7,738,121
- Issue date Jun 15, 2010
- GII Acquisition, LLC
- John D. Spalding
- G01 - MEASURING TESTING
Information Patent Grant
Optical method and system for generating calibration data for use i...
- Patent number 7,738,088
- Issue date Jun 15, 2010
- GII Acquisition, LLC
- John D. Spalding
- G01 - MEASURING TESTING
Information Patent Grant
Profile inspection system for threaded and axial components
- Patent number 7,684,054
- Issue date Mar 23, 2010
- GII Acquisition, LLC
- David Crowther
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM FOR MANUFACTURED COMPONENTS
- Publication number 20220034788
- Publication date Feb 3, 2022
- GII Acquisition, LLC d/b/a General Inspection, LLC
- Greg Nygaard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT AN INSPECTI...
- Publication number 20170333953
- Publication date Nov 23, 2017
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. NYGAARD
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING HEADED MANUFACTURED PARTS
- Publication number 20170307541
- Publication date Oct 26, 2017
- GII Acquisition, LLC d/b/a General Inspection, LLC
- Robert Joseph OFFENBORN
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING HEADED MANUFACTURED PARTS
- Publication number 20170307538
- Publication date Oct 26, 2017
- GII Acquisition, LLC d/b/a General Inspection, LLC
- Robert Joseph OFFENBORN
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
HIGH SPEED METHOD AND SYSTEM FOR INSPECTING A STREAM OF PARTS
- Publication number 20170216889
- Publication date Aug 3, 2017
- GII Acquisition, LLC dba General Inspection, LLC
- Nathan Andrew-Paul Kujacznski
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
NON-CONTACT METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT...
- Publication number 20170118457
- Publication date Apr 27, 2017
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- F42 - AMMUNITION BLASTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- Publication number 20160231253
- Publication date Aug 11, 2016
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING THE ENDS OF A MANUFACTUR...
- Publication number 20160109383
- Publication date Apr 21, 2016
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING A MANUFACTURED PART AT A...
- Publication number 20160025644
- Publication date Jan 28, 2016
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED METHOD AND SYSTEM FOR INSPECTING A STREAM OF PARTS AT A...
- Publication number 20150290683
- Publication date Oct 15, 2015
- GII Acquisition, LLC dba General Inspection, LLC
- Nathan Andrew-Paul Kujacznski
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- Publication number 20150253259
- Publication date Sep 10, 2015
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
PROFILE INSPECTION SYSTEM FOR THREADED AND AXIAL COMPONENTS
- Publication number 20150241207
- Publication date Aug 27, 2015
- GII Acquisition, LLC dba General Inspection, LLC
- David Crowther
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT...
- Publication number 20150204798
- Publication date Jul 23, 2015
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION IMAGING AND PROCESSING METHOD AND SYSTEM FOR INCREA...
- Publication number 20150055145
- Publication date Feb 26, 2015
- GII Acquisition, LLC dba General Inspection, LLC
- Christopher C. Fleming
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION IMAGING AND PROCESSING METHOD AND SYSTEM FOR DETERM...
- Publication number 20150055144
- Publication date Feb 26, 2015
- GII Acquisition, LLC dba General Inspection, LLC
- Christopher C. Fleming
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SPEED, HIGH-RESOLUTION, TRIANGULATION-BASED, 3-D METHOD AND SY...
- Publication number 20140346095
- Publication date Nov 27, 2014
- GII Acquisition, LLC dba General Inspection, LLC
- Nathan Andrew-Paul KUJACZNSKI
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY MEASURING A GEOMETR...
- Publication number 20140168661
- Publication date Jun 19, 2014
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- F42 - AMMUNITION BLASTING
Information Patent Application
HIGH-SPEED METHOD AND SYSTEM FOR OPTICALLY MEASURING A GEOMETRIC DI...
- Publication number 20140063509
- Publication date Mar 6, 2014
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- Publication number 20140036260
- Publication date Feb 6, 2014
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING OUTER PERIPHERAL SURFACE...
- Publication number 20130258046
- Publication date Oct 3, 2013
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- Publication number 20130235371
- Publication date Sep 12, 2013
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING DOSAGE FORMS HAVING CODE IMPRINTS...
- Publication number 20130022250
- Publication date Jan 24, 2013
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING SMALL MANUFACTURED OBJECTS AT A PL...
- Publication number 20120293623
- Publication date Nov 22, 2012
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- Publication number 20120293789
- Publication date Nov 22, 2012
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING DOSAGE FORMS HAVING CODE IMPRINTS...
- Publication number 20120293649
- Publication date Nov 22, 2012
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- Publication number 20120268748
- Publication date Oct 25, 2012
- GII Acquisition, LLC dba General Inspection, LLC
- Eric M. Walstra
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR HIGH-SPEED, HIGH-RESOLUTION 3-D IMAGING OF MA...
- Publication number 20120105429
- Publication date May 3, 2012
- GII Acquisition, LLC dba General Inspection, LLC
- Michael G. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CENTERING AND ALIGNING MANUFACTURED PARTS OF...
- Publication number 20110043803
- Publication date Feb 24, 2011
- GII Acquisition, LLC dba General Inspection, LLC
- Gregory M. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METHOD AND SYSTEM FOR GENERATING CALIBRATION DATA FOR USE I...
- Publication number 20100265324
- Publication date Oct 21, 2010
- GII Acquisition, LLC dba General Inspection, LLC
- John D. Spalding
- G01 - MEASURING TESTING
Information Patent Application
System For Indirectly Measuring A Geometric Dimension Related To An...
- Publication number 20100245850
- Publication date Sep 30, 2010
- GII Acquisition, LLC dba General Inspection, LLC
- Brett J. Lee
- F42 - AMMUNITION BLASTING

GII Acquisition, LLC dba General Inspection, LLC

Organization

Patents Grantslast 30 patents

Profile inspection system for threaded and axial components

Profile inspection system for threaded and axial components

Method and system for optically inspecting headed manufactured parts

Method and system for optically inspecting headed manufactured parts

Method and system for optically inspecting parts

Non-contact method and system for inspecting a manufactured part at...

High speed method and system for inspecting a stream of parts at a...

High-speed, triangulation-based, 3-D method and system for inspecti...

High-resolution imaging and processing method and system for increa...

Method and system for optically inspecting a manufactured part at a...

Method and system for optically inspecting the ends of a manufactur...

High speed method and system for inspecting a stream of parts

Method and system for optically inspecting parts

High-speed, high-resolution, triangulation-based, 3-D method and sy...

High-speed, 3-D method and system for optically measuring a geometr...

Method and system for optically inspecting parts

Method and system for centering and aligning manufactured parts of...

Method and system for optically inspecting parts

Method and system for automatically inspecting parts and for automa...

Apparatus for quickly retaining and releasing parts to be optically...

Calibration device for use in an optical part measuring system

Non-contact method and system for inspecting parts

Optical method and system for generating calibration data for use i...

Method and system for inspecting parts utilizing triangulation

Method for precisely measuring position of a part to be inspected a...

Method and system for optically inspecting parts

Calibration device for use in an optical part measuring system

Method and inspection head apparatus for optically measuring geomet...

Optical method and system for generating calibration data for use i...

Profile inspection system for threaded and axial components

Patents Applicationslast 30 patents

INSPECTION SYSTEM FOR MANUFACTURED COMPONENTS

METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT AN INSPECTI...

METHOD AND SYSTEM FOR OPTICALLY INSPECTING HEADED MANUFACTURED PARTS

METHOD AND SYSTEM FOR OPTICALLY INSPECTING HEADED MANUFACTURED PARTS

HIGH SPEED METHOD AND SYSTEM FOR INSPECTING A STREAM OF PARTS

NON-CONTACT METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT...

METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS

METHOD AND SYSTEM FOR OPTICALLY INSPECTING THE ENDS OF A MANUFACTUR...

METHOD AND SYSTEM FOR OPTICALLY INSPECTING A MANUFACTURED PART AT A...

HIGH SPEED METHOD AND SYSTEM FOR INSPECTING A STREAM OF PARTS AT A...

HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS

PROFILE INSPECTION SYSTEM FOR THREADED AND AXIAL COMPONENTS

NON-CONTACT METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT...

HIGH-RESOLUTION IMAGING AND PROCESSING METHOD AND SYSTEM FOR INCREA...

HIGH-RESOLUTION IMAGING AND PROCESSING METHOD AND SYSTEM FOR DETERM...

HIGH-SPEED, HIGH-RESOLUTION, TRIANGULATION-BASED, 3-D METHOD AND SY...

HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY MEASURING A GEOMETR...

HIGH-SPEED METHOD AND SYSTEM FOR OPTICALLY MEASURING A GEOMETRIC DI...

METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS

METHOD AND SYSTEM FOR OPTICALLY INSPECTING OUTER PERIPHERAL SURFACE...

HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS

METHOD AND SYSTEM FOR INSPECTING DOSAGE FORMS HAVING CODE IMPRINTS...

METHOD AND SYSTEM FOR INSPECTING SMALL MANUFACTURED OBJECTS AT A PL...

METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS

METHOD AND SYSTEM FOR INSPECTING DOSAGE FORMS HAVING CODE IMPRINTS...

METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS

METHOD AND SYSTEM FOR HIGH-SPEED, HIGH-RESOLUTION 3-D IMAGING OF MA...

METHOD AND SYSTEM FOR CENTERING AND ALIGNING MANUFACTURED PARTS OF...

OPTICAL METHOD AND SYSTEM FOR GENERATING CALIBRATION DATA FOR USE I...

System For Indirectly Measuring A Geometric Dimension Related To An...

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