Global Wafers Co., Ltd

Organization

Hsinchu, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for polishing pad control
- Patent number 10,960,513
- Issue date Mar 30, 2021
- Global Wafers Co., Ltd
- Emanuele Corsi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon substrates with compressive stress and methods for producti...
- Patent number 9,633,843
- Issue date Apr 25, 2017
- Global Wafers Co., Ltd
- Yao-Chung Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon substrates with compressive stress and methods for producti...
- Patent number 9,378,946
- Issue date Jun 28, 2016
- Global Wafers Co., Ltd
- Yao-Chung Chang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS FOR PRODUCING A MONOCRYSTALLINE INGOT THAT INVOLVE MONITORI...
- Publication number 20200002840
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Zheng Lu
- C01 - INORGANIC CHEMISTRY
Information Patent Application
METHODS FOR MODELING THE IMPURITY CONCENTRATION OF A SINGLE CRYSTAL...
- Publication number 20200002837
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR DETERMINING THE RESISTIVITY OF A POLYCRYSTALLINE SILICO...
- Publication number 20200002835
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
SAMPLE ROD GROWTH AND RESISTIVITY MEASUREMENT DURING SINGLE CRYSTAL...
- Publication number 20200002836
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR PRODUCING A SILICON INGOT THAT INVOLVE MONITORING A MOV...
- Publication number 20200002838
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Zheng Lu
- C30 - CRYSTAL GROWTH
Information Patent Application
MONITORING A MOVING AVERAGE OF THE INGOT NECK PULL RATE TO CONTROL...
- Publication number 20200002839
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Zheng Lu
- C30 - CRYSTAL GROWTH
Information Patent Application
GROWTH OF PLURAL SAMPLE RODS TO DETERMINE IMPURITY BUILD-UP DURING...
- Publication number 20200002843
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
Polishing Slurries for Polishing Semiconductor Wafers
- Publication number 20190035675
- Publication date Jan 31, 2019
- Global Wafers Co., Ltd
- Hui Wang
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
SEMICONDUCTOR HETEROSTRUCTURES AND METHODS FOR FORMING SAME
- Publication number 20180323265
- Publication date Nov 8, 2018
- Global Wafers Co., Ltd
- Jia-Zhe Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON SUBSTRATES WITH COMPRESSIVE STRESS AND METHODS FOR PRODUCTI...
- Publication number 20160307754
- Publication date Oct 20, 2016
- Global Wafers Co., Ltd
- Yao-Chung Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON SUBSTRATES WITH COMPRESSIVE STRESS AND METHODS FOR PRODUCTI...
- Publication number 20150380242
- Publication date Dec 31, 2015
- Global Wafers Co., Ltd
- Yao-Chung Chang
- H01 - BASIC ELECTRIC ELEMENTS

Global Wafers Co., Ltd

Organization

Patents Grantslast 30 patents

Methods and systems for polishing pad control

Silicon substrates with compressive stress and methods for producti...

Silicon substrates with compressive stress and methods for producti...

Patents Applicationslast 30 patents

SYSTEMS FOR PRODUCING A MONOCRYSTALLINE INGOT THAT INVOLVE MONITORI...

METHODS FOR MODELING THE IMPURITY CONCENTRATION OF A SINGLE CRYSTAL...

METHODS FOR DETERMINING THE RESISTIVITY OF A POLYCRYSTALLINE SILICO...

SAMPLE ROD GROWTH AND RESISTIVITY MEASUREMENT DURING SINGLE CRYSTAL...

METHODS FOR PRODUCING A SILICON INGOT THAT INVOLVE MONITORING A MOV...

MONITORING A MOVING AVERAGE OF THE INGOT NECK PULL RATE TO CONTROL...

GROWTH OF PLURAL SAMPLE RODS TO DETERMINE IMPURITY BUILD-UP DURING...

Polishing Slurries for Polishing Semiconductor Wafers

SEMICONDUCTOR HETEROSTRUCTURES AND METHODS FOR FORMING SAME

SILICON SUBSTRATES WITH COMPRESSIVE STRESS AND METHODS FOR PRODUCTI...

SILICON SUBSTRATES WITH COMPRESSIVE STRESS AND METHODS FOR PRODUCTI...

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