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Patents Grantslast 30 patents

Information Patent Grant
Method and system for particle characterization and identification
- Patent number 11,237,089
- Issue date Feb 1, 2022
- Hal Technology, LLC
- Hai Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for emissions measurement
- Patent number 10,627,343
- Issue date Apr 21, 2020
- Hal Technology, LLC
- Hai Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for particle characterization and identification
- Publication number 20200256777
- Publication date Aug 13, 2020
- Hal Technology, LLC
- Hai Lin
- G01 - MEASURING TESTING
Information Patent Application
Method and system for emissions measurement
- Publication number 20190302011
- Publication date Oct 3, 2019
- Hal Technology, LLC
- Hai Lin
- G01 - MEASURING TESTING
Information Patent Application
Method and system for particle characterization in harsh environments
- Publication number 20190226965
- Publication date Jul 25, 2019
- Hal Technology, LLC
- Hai Lin
- G01 - MEASURING TESTING

Trademarklast 30 trademarks