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IC test system
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Patent number 10,527,669
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Issue date Jan 7, 2020
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HappyJapan, Inc.
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Shouhei Matsumoto
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G01 - MEASURING TESTING
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IC handler
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Patent number 10,473,715
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Issue date Nov 12, 2019
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HappyJapan Inc.
-
Shouhei Matsumoto
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G01 - MEASURING TESTING
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IC handler
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Patent number 10,222,413
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Issue date Mar 5, 2019
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HappyJapan Inc.
-
Shouhei Matsumoto
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G01 - MEASURING TESTING
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79188624 - HAPPYJAPAN
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Serial number 79188624
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Registration number 5234319
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Filing date Dec 15, 2015
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HappyJapan Inc.
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7 - Machines and machine tools