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HARRIS INSTRUMENT CORPORATION
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Delaware, OH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for binocular measurement system
Patent number
6,314,812
Issue date
Nov 13, 2001
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
System for the measurement of the cut length of moving articles
Patent number
6,201,604
Issue date
Mar 13, 2001
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for binocular measurement system
Patent number
6,196,068
Issue date
Mar 6, 2001
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting small holes in moving articles
Patent number
6,104,037
Issue date
Aug 15, 2000
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
System for the measurement of the cut length of moving articles
Patent number
6,052,192
Issue date
Apr 18, 2000
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting small holes in moving articles
Patent number
5,969,373
Issue date
Oct 19, 1999
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for binocular measurement system
Patent number
5,911,161
Issue date
Jun 8, 1999
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
System for the measurement of the cut length of moving articles
Patent number
5,867,274
Issue date
Feb 2, 1999
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for binocular measurement system
Patent number
5,821,423
Issue date
Oct 13, 1998
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting small holes in moving articles
Patent number
5,798,531
Issue date
Aug 25, 1998
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for binocular measurement system
Patent number
5,546,808
Issue date
Aug 20, 1996
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus employing a linear array IR region radiation d...
Patent number
5,347,135
Issue date
Sep 13, 1994
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for edge detection and location
Patent number
5,220,177
Issue date
Jun 15, 1993
Harris Instrument Corporation
David E. Harris
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Trademark
last 30 trademarks
Information
Trademark
75582281 - I R T INDUSTRIAL RESISTANCE TESTER
Serial number
75582281
Registration number
2499334
Filing date
Nov 3, 1998
HARRIS INSTRUMENT CORPORATION
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
73711660 - SCAN-A-LINE
Serial number
73711660
Registration number
1525348
Filing date
Feb 16, 1988
HARRIS INSTRUMENT CORPORATION
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments