Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik

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Sindelfingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measuring a physical parameter and method of operatin...
- Patent number 11,018,911
- Issue date May 25, 2021
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Dominic Czempas
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring probe for non-destructive measuring of the thickness of t...
- Patent number 10,584,952
- Issue date Mar 10, 2020
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe for non-destructive measuring of the thickness of t...
- Patent number 9,857,171
- Issue date Jan 2, 2018
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe for non-destructive measuring of the thickness of t...
- Patent number 9,074,880
- Issue date Jul 7, 2015
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring the thickness of thin layers over l...
- Patent number 8,474,151
- Issue date Jul 2, 2013
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring mechanical properties of materials
- Patent number 8,393,200
- Issue date Mar 12, 2013
- Helmut Fischer GmbH, Institut fuer Elektronik und Messtechnik
- Bernhard Scherzinger
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MEASURING DEVICE FOR DETECTING MEASUREMENT SIGNALS
- Publication number 20240230490
- Publication date Jul 11, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Tanja Haas
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE AND OPERATING METHOD THEREFOR
- Publication number 20240055216
- Publication date Feb 15, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING PROBE, IN PARTICULAR FOR THE TACTILE MEASUREMENT ON A SUR...
- Publication number 20240004818
- Publication date Jan 4, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Bilal Akra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL CHARA...
- Publication number 20230388033
- Publication date Nov 30, 2023
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL
- Publication number 20230314316
- Publication date Oct 5, 2023
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TRANSMITTING AND/OR RECEIVING TERAHERTZ RADIATION, AN...
- Publication number 20230175960
- Publication date Jun 8, 2023
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPLIANCE WITH INDUCTIVE SENSOR
- Publication number 20210164766
- Publication date Jun 3, 2021
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Gerd REIME
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS FOR MEASURING A PHYSICAL PARAMETER AND METHOD OF OPERATIN...
- Publication number 20200177421
- Publication date Jun 4, 2020
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Dominic CZEMPAS
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASURING PROBE FOR NON-DESTRUCTIVE MEASURING OF THE THICKNESS OF T...
- Publication number 20150253122
- Publication date Sep 10, 2015
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING

Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik

Organization

Patents Grantslast 30 patents

Apparatus for measuring a physical parameter and method of operatin...

Measuring probe for non-destructive measuring of the thickness of t...

Measuring probe for non-destructive measuring of the thickness of t...

Measuring probe for non-destructive measuring of the thickness of t...

Method and device for measuring the thickness of thin layers over l...

Device and method for measuring mechanical properties of materials

Patents Applicationslast 30 patents

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

METHOD AND MEASURING DEVICE FOR DETECTING MEASUREMENT SIGNALS

X-RAY SOURCE AND OPERATING METHOD THEREFOR

MEASURING PROBE, IN PARTICULAR FOR THE TACTILE MEASUREMENT ON A SUR...

METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL CHARA...

METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL

APPARATUS FOR TRANSMITTING AND/OR RECEIVING TERAHERTZ RADIATION, AN...

ELECTRONIC APPLIANCE WITH INDUCTIVE SENSOR

APPARATUS FOR MEASURING A PHYSICAL PARAMETER AND METHOD OF OPERATIN...

MEASURING PROBE FOR NON-DESTRUCTIVE MEASURING OF THE THICKNESS OF T...