Hermes-Microvision, Inc.

Organization

Hsinchu, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,643,820
- Issue date May 5, 2020
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,468,227
- Issue date Nov 5, 2019
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for fast inspecting defects
- Patent number 10,380,731
- Issue date Aug 13, 2019
- Hermes Microvision Inc.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test device for defect inspection
- Patent number 10,274,537
- Issue date Apr 30, 2019
- Hermes Microvision Inc.
- Chang-Chun Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,276,347
- Issue date Apr 30, 2019
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,236,156
- Issue date Mar 19, 2019
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Load lock system for charged particle beam imaging
- Patent number 10,176,967
- Issue date Jan 8, 2019
- Hermes-Microvision, Inc.
- Hsuan-Bin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,141,160
- Issue date Nov 27, 2018
- Hermes-Microvision, Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,115,559
- Issue date Oct 30, 2018
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,109,456
- Issue date Oct 23, 2018
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method and system
- Patent number 10,102,619
- Issue date Oct 16, 2018
- Hermes-Microvision, Inc.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 10,088,438
- Issue date Oct 2, 2018
- Hermes-Microvision, Inc.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,062,541
- Issue date Aug 28, 2018
- Hermes Microvision Inc.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 10,054,556
- Issue date Aug 21, 2018
- Hermes Microvision Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,032,600
- Issue date Jul 24, 2018
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,020,164
- Issue date Jul 10, 2018
- Hermes Microvision Inc.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens system for fast scanning large FOV
- Patent number 10,008,360
- Issue date Jun 26, 2018
- Hermes Microvision Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer grounding and biasing method, apparatus, and application
- Patent number 9,991,147
- Issue date Jun 5, 2018
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inspection method and system
- Patent number 9,965,844
- Issue date May 8, 2018
- Hermes Microvision Inc.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Local alignment point calibration method in die inspection
- Patent number 9,953,803
- Issue date Apr 24, 2018
- Hermes Microvision Inc.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 9,922,799
- Issue date Mar 20, 2018
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting and grounding an EUV mask
- Patent number 9,859,089
- Issue date Jan 2, 2018
- Hermes Microvision Inc.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,812,283
- Issue date Nov 7, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,799,484
- Issue date Oct 24, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and machine for examining wafers
- Patent number 9,768,082
- Issue date Sep 19, 2017
- Hermes Microvision Inc.
- Chien-Hung Chou
- G05 - CONTROLLING REGULATING
Information Patent Grant
Charged particle source
- Patent number 9,754,760
- Issue date Sep 5, 2017
- Hermes Microvision Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 9,691,586
- Issue date Jun 27, 2017
- Hermes-Microvision, Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 9,691,588
- Issue date Jun 27, 2017
- Hermes-Microvision, Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 9,607,805
- Issue date Mar 28, 2017
- Hermes Microvision Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal seal for ultra high vacuum system
- Patent number 9,605,759
- Issue date Mar 28, 2017
- Hermes Microvision Inc.
- Qingpo Xi
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

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Patents Applicationslast 30 patents

Information Patent Application
LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING
- Publication number 20190214225
- Publication date Jul 11, 2019
- HERMES MICROVISION, INC.
- Hsuan-Bin HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20190172677
- Publication date Jun 6, 2019
- HERMES MICROVISION, INC.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AN EUV MASK
- Publication number 20190170671
- Publication date Jun 6, 2019
- HERMES MICROVISION, INC.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE BEAM MODULATION
- Publication number 20190164721
- Publication date May 30, 2019
- HERMES MICROVISION, INC.
- Ehud SHAKED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION METHOD AND SYSTEM
- Publication number 20190147579
- Publication date May 16, 2019
- HERMES MICROVISION, INC.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV
- Publication number 20190096628
- Publication date Mar 28, 2019
- HERMES MICROVISION, INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20190074157
- Publication date Mar 7, 2019
- HERMES MICROVISION, INC.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20190057837
- Publication date Feb 21, 2019
- HERMES MICROVISION, INC.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20190057833
- Publication date Feb 21, 2019
- HERMES MICROVISION, INC.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20190043691
- Publication date Feb 7, 2019
- HERMES MICROVISION, INC.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR...
- Publication number 20190035595
- Publication date Jan 31, 2019
- HERMES MICROVISION, INC.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20180350555
- Publication date Dec 6, 2018
- HERMES MICROVISION, INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Local Alignment Point Calibration Method in Die Inspection
- Publication number 20180247789
- Publication date Aug 30, 2018
- Hermes Microvision Inc.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING
- Publication number 20180240645
- Publication date Aug 23, 2018
- HERMES MICROVISION INC.
- HSUAN-BIN HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND MACHINE FOR EXAMINING WAFERS
- Publication number 20180076099
- Publication date Mar 15, 2018
- HERMES MICROVISION, INC.
- CHIEN-HUNG CHOU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20170309449
- Publication date Oct 26, 2017
- HERMES MICROVISION, INC.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus of Plural Charged-Particle Beams
- Publication number 20170213688
- Publication date Jul 27, 2017
- HERMES MICROVISION INC.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Application
Test Device for Defect Inspection
- Publication number 20170176358
- Publication date Jun 22, 2017
- HERMES MICROVISION INC.
- Roland YEH
- G01 - MEASURING TESTING
Information Patent Application
Apparatus of Plural Charged-Particle Beams
- Publication number 20170154756
- Publication date Jun 1, 2017
- HERMES MICROVISION INC.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125202
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125203
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus of Plural Charged-Particle Beams
- Publication number 20170125205
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus of Plural Charged-Particle Beams
- Publication number 20170125206
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125204
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AN EUV MASK
- Publication number 20170052129
- Publication date Feb 23, 2017
- HERMES MICROVISION, INC.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...
- Publication number 20170053774
- Publication date Feb 23, 2017
- HERMES MICROVISION INC.
- You-Jin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus of Plural Charged-Particle Beams
- Publication number 20170025243
- Publication date Jan 26, 2017
- HERMES MICROVISION, INC.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus of Plural Charged-Particle Beams
- Publication number 20170025241
- Publication date Jan 26, 2017
- HERMES MICROVISION, INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Calibrating Charge-Regulating Module
- Publication number 20160343534
- Publication date Nov 24, 2016
- HERMES MICROVISION INC.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus of Plural Charged-Particle Beams
- Publication number 20160336142
- Publication date Nov 17, 2016
- HERMES MICROVISION INC.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS

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Trademarklast 30 trademarks

Information Trademark
86887655 - ASE
- Serial number 86887655
- Registration number 5169426
- Filing date Jan 27, 2016
- Hermes Microvision Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86887647 - ASE
- Serial number 86887647
- Registration number 5122030
- Filing date Jan 27, 2016
- Hermes Microvision Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86881702 - SKYSCAN
- Serial number 86881702
- Registration number 5149239
- Filing date Jan 21, 2016
- Hermes Microvision Inc.
- 37 - Building construction
Information Trademark
86881711 - NANOSCAN
- Serial number 86881711
- Filing date Jan 21, 2016
- Hermes Microvision Inc.
- 37 - Building construction
Information Trademark
86592957 - JUPITER
- Serial number 86592957
- Registration number 4962670
- Filing date Apr 9, 2015
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86592940 - JUPITER
- Serial number 86592940
- Registration number 4858605
- Filing date Apr 9, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86592950 - JUPITER
- Serial number 86592950
- Registration number 4865952
- Filing date Apr 9, 2015
- HERMES MICROVISION, INC.
- 37 - Building construction
Information Trademark
86535662 - PARASCAN
- Serial number 86535662
- Registration number 4912323
- Filing date Feb 16, 2015
- HERMES MICROVISION, INC.
- 37 - Building construction
Information Trademark
86535667 - PARASCAN
- Serial number 86535667
- Registration number 4912324
- Filing date Feb 16, 2015
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86535659 - PARASCAN
- Serial number 86535659
- Registration number 4879933
- Filing date Feb 16, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86535223 - MULTISCAN
- Serial number 86535223
- Registration number 4912321
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 37 - Building construction
Information Trademark
86535217 - MULTIBEAM
- Serial number 86535217
- Registration number 4912320
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86535227 - MULTISCAN
- Serial number 86535227
- Registration number 4912322
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86535212 - MULTIBEAM
- Serial number 86535212
- Registration number 4879928
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86533975 - PARABEAM
- Serial number 86533975
- Registration number 4879922
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86535220 - MULTISCAN
- Serial number 86535220
- Registration number 4879929
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86533979 - PARABEAM
- Serial number 86533979
- Registration number 4912318
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86533977 - PARABEAM
- Serial number 86533977
- Registration number 4912317
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 37 - Building construction
Information Trademark
86535214 - MULTIBEAM
- Serial number 86535214
- Registration number 4912319
- Filing date Feb 13, 2015
- HERMES MICROVISION, INC.
- 37 - Building construction
Information Trademark
86505220 - EMANAGER
- Serial number 86505220
- Registration number 5047703
- Filing date Jan 16, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86505221 - NANOSCAN
- Serial number 86505221
- Filing date Jan 16, 2015
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86505223 - NANOSCAN
- Serial number 86505223
- Registration number 5475812
- Filing date Jan 16, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86505219 - SUPERNOVA
- Serial number 86505219
- Registration number 4912238
- Filing date Jan 16, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86504000 - SKYSCAN
- Serial number 86504000
- Registration number 4917393
- Filing date Jan 15, 2015
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86504004 - SKYSCAN
- Serial number 86504004
- Registration number 4917394
- Filing date Jan 15, 2015
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
86372394 - ESCAN
- Serial number 86372394
- Registration number 4712540
- Filing date Aug 20, 2014
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85948566 - MICROVISION
- Serial number 85948566
- Registration number 4591240
- Filing date Jun 3, 2013
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85948568 - MICROVISION
- Serial number 85948568
- Registration number 4536135
- Filing date Jun 3, 2013
- HERMES MICROVISION, INC.
- 37 - Building construction
Information Trademark
85948569 - MICROVISION
- Serial number 85948569
- Registration number 4532254
- Filing date Jun 3, 2013
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
85717858 - HMI
- Serial number 85717858
- Registration number 4417088
- Filing date Aug 31, 2012
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Hermes-Microvision, Inc.

Organization

Patents Grantslast 30 patents

Apparatus of plural charged-particle beams

Charged particle source

Method and system for fast inspecting defects

Test device for defect inspection

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Load lock system for charged particle beam imaging

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Inspection method and system

Method and system for inspecting an EUV mask

Apparatus of plural charged-particle beams

Structure electron beam inspection system for inspecting extreme ul...

Charged particle source

Charged particle beam apparatus

Objective lens system for fast scanning large FOV

Wafer grounding and biasing method, apparatus, and application

Inspection method and system

Local alignment point calibration method in die inspection

Apparatus of plural charged-particle beams

Method and system for inspecting and grounding an EUV mask

Charged particle source

Charged particle source

Method and machine for examining wafers

Charged particle source

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Metal seal for ultra high vacuum system

Patents Applicationslast 30 patents

LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

METHOD AND SYSTEM FOR INSPECTING AN EUV MASK

SYSTEMS AND METHODS FOR CHARGED PARTICLE BEAM MODULATION

INSPECTION METHOD AND SYSTEM

OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

Charged Particle Source

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

Local Alignment Point Calibration Method in Die Inspection

LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING

METHOD AND MACHINE FOR EXAMINING WAFERS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

Apparatus of Plural Charged-Particle Beams

Test Device for Defect Inspection

Apparatus of Plural Charged-Particle Beams

Charged Particle Source

Charged Particle Source

Apparatus of Plural Charged-Particle Beams

Apparatus of Plural Charged-Particle Beams

Charged Particle Source

METHOD AND SYSTEM FOR INSPECTING AN EUV MASK

STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...

Apparatus of Plural Charged-Particle Beams

Apparatus of Plural Charged-Particle Beams

System and Method for Calibrating Charge-Regulating Module

Apparatus of Plural Charged-Particle Beams

Trademarklast 30 trademarks

86887655 - ASE

86887647 - ASE

86881702 - SKYSCAN

86881711 - NANOSCAN

86592957 - JUPITER

86592940 - JUPITER

86592950 - JUPITER

86535662 - PARASCAN

86535667 - PARASCAN

86535659 - PARASCAN

86535223 - MULTISCAN

86535217 - MULTIBEAM

86535227 - MULTISCAN

86535212 - MULTIBEAM

86533975 - PARABEAM