HICON CO., LTD.

Organization

Gyeonggi-do, KR

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Spring contact and test socket with same
- Patent number 11,982,688
- Issue date May 14, 2024
- Hicon Co., Ltd.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact and test socket with same
- Patent number 11,561,241
- Issue date Jan 24, 2023
- Hicon Co., Ltd.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Socket apparatus for semiconductor device test
- Patent number 10,241,132
- Issue date Mar 26, 2019
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact
- Patent number 10,094,852
- Issue date Oct 9, 2018
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Socket device for testing semiconductor device
- Patent number 9,494,616
- Issue date Nov 15, 2016
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Socket device for an IC test
- Patent number 9,435,853
- Issue date Sep 6, 2016
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact and a socket embedded with spring contacts
- Patent number 8,808,038
- Issue date Aug 19, 2014
- Hicon Co., Ltd.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Structure for a spring contact
- Patent number 8,715,015
- Issue date May 6, 2014
- Hicon Co., Ltd.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
SOCKET DEVICE FOR TESTING ICs
- Publication number 20240183879
- Publication date Jun 6, 2024
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
MEMORY MODULE SOCKET
- Publication number 20240069607
- Publication date Feb 29, 2024
- HICON CO., LTD.
- Dong Weon HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPRING CONTACT AND TEST SOCKET WITH SAME
- Publication number 20230043825
- Publication date Feb 9, 2023
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT AND SOCKET HAVING SPRING CONTACT EMBEDDED THEREIN
- Publication number 20220206041
- Publication date Jun 30, 2022
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN FOR TESTING SEMICONDUCTOR IC FOR HIGH SPEED SIGNAL, SPR...
- Publication number 20220209449
- Publication date Jun 30, 2022
- HICON CO., LTD.
- Dong Weon HWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT AND SOCKET DEVICE FOR BURNING-IN AND TESTING SEMICONDUCTOR IC
- Publication number 20220196727
- Publication date Jun 23, 2022
- HICON CO., LTD.
- Dong Weon HWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIDLESS BGA SOCKET APPARATUS FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20220163561
- Publication date May 26, 2022
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT AND TEST SOCKET WITH SAME
- Publication number 20210102973
- Publication date Apr 8, 2021
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
SOCKET APPARATUS FOR SEMICONDUCTOR DEVICE TEST
- Publication number 20170045551
- Publication date Feb 16, 2017
- HICON CO., LTD
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20150377924
- Publication date Dec 31, 2015
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT
- Publication number 20150377925
- Publication date Dec 31, 2015
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
SOCKET DEVICE FOR AN IC TEST
- Publication number 20140239993
- Publication date Aug 28, 2014
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT AND A SOCKET EMBEDDED WITH SPRING CONTACTS
- Publication number 20120238136
- Publication date Sep 20, 2012
- Dong Weon HWANG
- Dong Weon Hwang
- G01 - MEASURING TESTING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
88752631 - HSR-CONTACT
- Serial number 88752631
- Registration number 6290602
- Filing date Jan 9, 2020
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88635722 - PROV-PIN
- Serial number 88635722
- Filing date Sep 30, 2019
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88485665 - HI-POGO
- Serial number 88485665
- Filing date Jun 24, 2019
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88485674 - HR-CONTACT
- Serial number 88485674
- Registration number 6273573
- Filing date Jun 24, 2019
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88485681 - HS-CONTACT
- Serial number 88485681
- Registration number 6273574
- Filing date Jun 24, 2019
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88485670 - HI-RUBBER
- Serial number 88485670
- Registration number 6273572
- Filing date Jun 24, 2019
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88485682 - HB-CONTACT
- Serial number 88485682
- Registration number 6273575
- Filing date Jun 24, 2019
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88263549 - HI-PIN
- Serial number 88263549
- Registration number 6185808
- Filing date Jan 16, 2019
- HiCon Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87599872 - HYBRID CONTACT
- Serial number 87599872
- Filing date Sep 7, 2017
- HICON CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76109451 - HICON
- Serial number 76109451
- Registration number 2471735
- Filing date Aug 15, 2000
- Hicon Inc.
- 37 - Building construction
Information Trademark
73201181 - HICON
- Serial number 73201181
- Registration number 1150637
- Filing date Jan 24, 1979
- Hicon Inc.
- 37 - Building construction

HICON CO., LTD.

Organization

Patents Grantslast 30 patents

Spring contact and test socket with same

Spring contact and test socket with same

Socket apparatus for semiconductor device test

Spring contact

Socket device for testing semiconductor device

Socket device for an IC test

Spring contact and a socket embedded with spring contacts

Structure for a spring contact

Patents Applicationslast 30 patents

SOCKET DEVICE FOR TESTING ICs

MEMORY MODULE SOCKET

SPRING CONTACT AND TEST SOCKET WITH SAME

SPRING CONTACT AND SOCKET HAVING SPRING CONTACT EMBEDDED THEREIN

CONTACT PIN FOR TESTING SEMICONDUCTOR IC FOR HIGH SPEED SIGNAL, SPR...

CONTACT AND SOCKET DEVICE FOR BURNING-IN AND TESTING SEMICONDUCTOR IC

LIDLESS BGA SOCKET APPARATUS FOR TESTING SEMICONDUCTOR DEVICE

SPRING CONTACT AND TEST SOCKET WITH SAME

SOCKET APPARATUS FOR SEMICONDUCTOR DEVICE TEST

SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE

SPRING CONTACT

SOCKET DEVICE FOR AN IC TEST

SPRING CONTACT AND A SOCKET EMBEDDED WITH SPRING CONTACTS

Trademarklast 30 trademarks

88752631 - HSR-CONTACT

88635722 - PROV-PIN

88485665 - HI-POGO

88485674 - HR-CONTACT

88485681 - HS-CONTACT

88485670 - HI-RUBBER

88485682 - HB-CONTACT

88263549 - HI-PIN

87599872 - HYBRID CONTACT

76109451 - HICON

73201181 - HICON