TREA

High Precision Devices, Inc.

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Organization

  • Boulder, CO, US
Organizations

Patents Grantslast 30 patents

  • Information Patent Grant

    Cryogenic wafer testing system
    • Patent number 11,927,621
    • Issue date Mar 12, 2024
    • High Precision Devices, Inc.
    • Michael Snow
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Cryogenic Wafer Testing System
    • Publication number 20230014966
    • Publication date Jan 19, 2023
    • High Precision Devices, Inc.
    • Michael Snow
    • H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

  • Information Trademark

    86099832 - CRYOBOSS
    • Serial number 86099832
    • Registration number 4598877
    • Filing date Oct 23, 2013
    • High Precision Devices, Inc.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

NSF Awardslast 12 months

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Count: 2

NSF Awards

NIH Research Projectlast 12 months

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Count: 1

Research Projects