HIGH YIELD TECHNOLOGY, INC.

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MOUNTAIN VIEW, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Self aligning vacuum seal assembly
- Patent number 5,773,841
- Issue date Jun 30, 1998
- High Yield Technology, Inc.
- Derek Aqui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method to detect non-spherical particles using orthogonally polariz...
- Patent number 5,637,881
- Issue date Jun 10, 1997
- High Yield Technology, Inc.
- Raymond Burghard
- G01 - MEASURING TESTING
Information Patent Grant
Quasi bright field particle sensor
- Patent number 5,606,418
- Issue date Feb 25, 1997
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Particle monitor for throttled pumping systems
- Patent number 5,534,706
- Issue date Jul 9, 1996
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Modular particle monitor for vacuum process equipment
- Patent number 5,436,465
- Issue date Jul 25, 1995
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and a method for dynamically tuning a particle sensor in...
- Patent number 5,424,558
- Issue date Jun 13, 1995
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Particle monitor for loadlock soft pump lines
- Patent number 5,406,830
- Issue date Apr 18, 1995
- High Yield Technology
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for providing a gas purge for a vacuum particl...
- Patent number 5,360,980
- Issue date Nov 1, 1994
- High Yield Technology
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
In situ real time particle monitor for a sputter coater chamber
- Patent number 5,347,138
- Issue date Sep 13, 1994
- High Yield Technology
- Derek G. Aqui
- G01 - MEASURING TESTING
Information Patent Grant
High sensitivity, large detection area particle sensor for vacuum a...
- Patent number 5,266,798
- Issue date Nov 30, 1993
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
Concentrator funnel for vacuum line particle monitors
- Patent number 5,247,188
- Issue date Sep 21, 1993
- High Yield Technology
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Method for synchronizing particle counters to external events
- Patent number 5,235,625
- Issue date Aug 10, 1993
- High Yield Technology
- James B. Stolz
- G01 - MEASURING TESTING
Information Patent Grant
Low cost stage for raster scanning of semiconductor wafers
- Patent number 5,212,580
- Issue date May 18, 1993
- High Yield Technology
- George L. Coad
- G02 - OPTICS
Information Patent Grant
Laser safe housing for a particle monitor in vacuum pump lines
- Patent number 5,157,678
- Issue date Oct 20, 1992
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
High sensitivity, large detection area particle sensor for vacuum a...
- Patent number 5,132,548
- Issue date Jul 21, 1992
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
Real-time particle sensor for disk drives
- Patent number 5,055,698
- Issue date Oct 8, 1991
- High Yield Technology, Inc.
- Peter Borden
- G11 - INFORMATION STORAGE
Information Patent Grant
Velocity monitoring method and apparatus
- Patent number 4,967,075
- Issue date Oct 30, 1990
- High Yield Technology
- Peter G. Borden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light scattering particle detector for wafer processing equipment
- Patent number RE33213
- Issue date May 8, 1990
- High Yield Technology
- Peter Borden
- 250 - Radiant energy
Information Patent Grant
Scattering-type particle detection device for use in high temperatu...
- Patent number 4,896,048
- Issue date Jan 23, 1990
- High Yield Technology
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Real-time particle counter for liquids with nebulizer and dryer
- Patent number 4,894,529
- Issue date Jan 16, 1990
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Real time particle fallout monitor with tubular structure
- Patent number 4,825,094
- Issue date Apr 25, 1989
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for scanning a flat surface to detect defects
- Patent number 4,812,664
- Issue date Mar 14, 1989
- High Yield Technology
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Compact particle flux monitor
- Patent number 4,804,853
- Issue date Feb 14, 1989
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of extremely small particles in a low pressure...
- Patent number 4,792,199
- Issue date Dec 20, 1988
- High Yield Technology
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Particle detector for flowing liquids with the ability to distingui...
- Patent number 4,783,599
- Issue date Nov 8, 1988
- High Yield Technology
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Light scattering particle detector for wafer processing equipment
- Patent number 4,739,177
- Issue date Apr 19, 1988
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
74147081 - MACHINE TRIGGER
- Serial number 74147081
- Registration number 1679249
- Filing date Mar 12, 1991
- High Yield Technology, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73778256 - PARTICLE VISION
- Serial number 73778256
- Registration number 1577449
- Filing date Feb 2, 1989
- HIGH YIELD TECHNOLOGY, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

HIGH YIELD TECHNOLOGY, INC.

Organization

Patents Grantslast 30 patents

Self aligning vacuum seal assembly

Method to detect non-spherical particles using orthogonally polariz...

Quasi bright field particle sensor

Particle monitor for throttled pumping systems

Modular particle monitor for vacuum process equipment

Apparatus and a method for dynamically tuning a particle sensor in...

Particle monitor for loadlock soft pump lines

Structure and method for providing a gas purge for a vacuum particl...

In situ real time particle monitor for a sputter coater chamber

High sensitivity, large detection area particle sensor for vacuum a...

Concentrator funnel for vacuum line particle monitors

Method for synchronizing particle counters to external events

Low cost stage for raster scanning of semiconductor wafers

Laser safe housing for a particle monitor in vacuum pump lines

High sensitivity, large detection area particle sensor for vacuum a...

Real-time particle sensor for disk drives

Velocity monitoring method and apparatus

Light scattering particle detector for wafer processing equipment

Scattering-type particle detection device for use in high temperatu...

Real-time particle counter for liquids with nebulizer and dryer

Real time particle fallout monitor with tubular structure

Apparatus for scanning a flat surface to detect defects

Compact particle flux monitor

System for detection of extremely small particles in a low pressure...

Particle detector for flowing liquids with the ability to distingui...

Light scattering particle detector for wafer processing equipment

Trademarklast 30 trademarks

74147081 - MACHINE TRIGGER

73778256 - PARTICLE VISION