Howell Laboratories, Incorporated

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Bridgton, ME, US

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Patents Grantslast 30 patents

Information Patent Grant
Linear flaw detector
- Patent number 4,184,082
- Issue date Jan 15, 1980
- Howell Laboratories, Incorporated
- Patrick J. Peoples
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the brightness of pulp slurry
- Patent number 4,040,743
- Issue date Aug 9, 1977
- Howell Laboratories, Incorporated
- Henry F. Villaume
- G01 - MEASURING TESTING