I1 Sendortech, Inc.

Organization

  • Kirkland, WA, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PERSONAL IMPACT MONITORING SYSTEM

    • Publication number 20160262694
    • Publication date Sep 15, 2016
    • I1 Sendortech, Inc.
    • Lawrence V. CALCANO
    • G01 - MEASURING TESTING

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