IAS L.L.C

Organization

IRVINE, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method for analyzing metal fine particles, and inductively coupled...
- Patent number 11,569,081
- Issue date Jan 31, 2023
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate analysis method and substrate analyzer
- Patent number 11,422,071
- Issue date Aug 23, 2022
- IAS, INC
- Katsuhiko Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Substrate analysis nozzle and method for analyzing substrate
- Patent number 10,688,485
- Issue date Jun 23, 2020
- IAS, INC
- Katsuhiko Kawabata
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic localized substrate analysis device and analysis method
- Patent number 10,151,727
- Issue date Dec 11, 2018
- IAS, INC
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis system for online-transferred analysis sample
- Patent number 10,024,801
- Issue date Jul 17, 2018
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate etching apparatus and substrate analysis method
- Patent number 9,741,627
- Issue date Aug 22, 2017
- IAS, INC
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solution feeding device
- Patent number 8,453,524
- Issue date Jun 4, 2013
- IAS Inc.
- Katsuhiko Kawabata
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED...
- Publication number 20230335387
- Publication date Oct 19, 2023
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE ANALYZING METHOD AND SUBSTRATE ANALYZING DEVICE
- Publication number 20220042882
- Publication date Feb 10, 2022
- IAS, INC.
- KATSUHIKO KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED...
- Publication number 20210148858
- Publication date May 20, 2021
- IAS Inc.
- Katsuhiko KKAWABATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING SILICON SUBSTRATE
- Publication number 20210118751
- Publication date Apr 22, 2021
- KIOXIA Corporation
- Jiahong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate Analysis Nozzle And Method For Analyzing Substrate
- Publication number 20190358622
- Publication date Nov 28, 2019
- IAS Inc.
- Katsuhiko Kawabata
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
NOZZLE FOR SUBSTRATE ANALYSIS
- Publication number 20190013248
- Publication date Jan 10, 2019
- IAS Inc.
- Katsuhiko Kawabata
- G01 - MEASURING TESTING
Information Patent Application
SILICON SUBSTRATE ANALYZING DEVICE
- Publication number 20180217036
- Publication date Aug 2, 2018
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR ANALYZING ONLINE-TRANSFERRED ASSAY SAMPLES
- Publication number 20180024068
- Publication date Jan 25, 2018
- IAS Inc.
- Katsuhiko Kawabata
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC LOCALIZED SUBSTRATE ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20170160233
- Publication date Jun 8, 2017
- IAS Inc.
- Katsuhiko Kawabata
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE ETCHING APPARATUS AND SUBSTRATE ANALYSIS METHOD
- Publication number 20150357249
- Publication date Dec 10, 2015
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-assurance processor active memory content protection
- Publication number 20060023486
- Publication date Feb 2, 2006
- IAS L.L.C.
- Michael Masaji Furusawa
- G06 - COMPUTING CALCULATING COUNTING

Trademarklast 30 trademarks

Information Trademark
88621411 - GED
- Serial number 88621411
- Registration number 6097881
- Filing date Sep 18, 2019
- IAS, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Organization

Patents Grantslast 30 patents

Method for analyzing metal fine particles, and inductively coupled...

Substrate analysis method and substrate analyzer

Substrate analysis nozzle and method for analyzing substrate

Automatic localized substrate analysis device and analysis method

Analysis system for online-transferred analysis sample

Substrate etching apparatus and substrate analysis method

Solution feeding device

Patents Applicationslast 30 patents

METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED...

SUBSTRATE ANALYZING METHOD AND SUBSTRATE ANALYZING DEVICE

METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED...

METHOD FOR ANALYZING SILICON SUBSTRATE

Substrate Analysis Nozzle And Method For Analyzing Substrate

NOZZLE FOR SUBSTRATE ANALYSIS

SILICON SUBSTRATE ANALYZING DEVICE

SYSTEM FOR ANALYZING ONLINE-TRANSFERRED ASSAY SAMPLES

AUTOMATIC LOCALIZED SUBSTRATE ANALYSIS DEVICE AND ANALYSIS METHOD

SUBSTRATE ETCHING APPARATUS AND SUBSTRATE ANALYSIS METHOD

High-assurance processor active memory content protection

Trademarklast 30 trademarks

88621411 - GED