IC KINETICS INC.

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Organization

Rye, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
System for on-chip temperature measurement in integrated circuits
- Patent number 9,222,843
- Issue date Dec 29, 2015
- IC Kinetics Inc.
- William N. Schnaitter
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR ON-CHIP TEMPERATURE MEASUREMENT IN INTEGRATED CIRCUITS
- Publication number 20190360872
- Publication date Nov 28, 2019
- IC KINETICS INC.
- William N. Schnaitter
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR ON-CHIP TEMPERATURE MEASUREMENT IN INTEGRATED CIRCUITS
- Publication number 20180356295
- Publication date Dec 13, 2018
- IC KINETICS INC.
- William N. Schnaitter
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR ON-CHIP TEMPERATURE MEASUREMENT IN INTEGRATED CIRCUITS
- Publication number 20160320247
- Publication date Nov 3, 2016
- IC KINETICS INC.
- William N. Schnaitter
- G01 - MEASURING TESTING