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IC Mems, Inc.
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Seoul, KR
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Patents Grants
last 30 patents
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Patent Grant
Probe structure for testing semiconductor devices and method for fa...
Patent number
6,724,204
Issue date
Apr 20, 2004
IC Mems, Inc.
Dong-il Cho
G01 - MEASURING TESTING
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Patents Applications
last 30 patents
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Patent Application
Probe structure for testing semiconductor devices and method for fa...
Publication number
20020153911
Publication date
Oct 24, 2002
IC MEMS, INC.
Dong-il Cho
G01 - MEASURING TESTING