ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH

Organization

Heimstetten, DE

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device with dynamic focus and method of opera...
- Patent number 9,431,210
- Issue date Aug 30, 2016
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device with dispersion compensation, and method of op...
- Patent number 9,048,068
- Issue date Jun 2, 2015
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contamination reduction electrode for particle detector
- Patent number 8,963,084
- Issue date Feb 24, 2015
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High brightness electron gun with moving condenser lens
- Patent number 8,921,804
- Issue date Dec 30, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi channel detector, optics therefor and method of operating the...
- Patent number 8,618,500
- Issue date Dec 31, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-axis lens, beam system making use of the compound lens, and m...
- Patent number 8,481,958
- Issue date Jul 9, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for high spatial resolution and multip...
- Patent number 7,544,937
- Issue date Jun 9, 2009
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
- Publication number 20150228452
- Publication date Aug 13, 2015
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan LANIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...
- Publication number 20150213998
- Publication date Jul 30, 2015
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM SYSTEM FOR HIGH THROUGHPUT EBI
- Publication number 20150155134
- Publication date Jun 4, 2015
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Jürgen FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHABLE MULTI PERSPECTIVE DETECTOR, OPTICS THEREFORE AND METHOD...
- Publication number 20150021474
- Publication date Jan 22, 2015
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Matthias FIRNKES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN ARRANGEMENT
- Publication number 20140264019
- Publication date Sep 18, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH BRIGHTNESS ELECTRON GUN, SYSTEM USING THE SAME, AND METHOD OF...
- Publication number 20140264063
- Publication date Sep 18, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTAMINATION REDUCTION ELECTRODE FOR PARTICLE DETECTOR
- Publication number 20140191127
- Publication date Jul 10, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
- Publication number 20140175277
- Publication date Jun 26, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH BRIGHTNESS ELECTRON GUN WITH MOVING CONDENSER LENS
- Publication number 20130327951
- Publication date Dec 12, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTAMINATION REDUCTION ELECTRODE FOR PARTICLE DETECTOR
- Publication number 20130320228
- Publication date Dec 5, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELEMENT FOR FAST MAGNETIC BEAM DEFLECTION
- Publication number 20130306863
- Publication date Nov 21, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Pavel ADAMEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI CHANNEL DETECTOR, OPTICS THEREFOR AND METHOD OF OPERATING THE...
- Publication number 20130270439
- Publication date Oct 17, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHABLE MULTI PERSPECTIVE DETECTOR, OPTICS THEREFOR AND METHOD O...
- Publication number 20130270438
- Publication date Oct 17, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan LANIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...
- Publication number 20130214155
- Publication date Aug 22, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE WITH TILTING AND DISPERSION COMPENSATION, AND...
- Publication number 20120006997
- Publication date Jan 12, 2012
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS

ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH

Organization

Patents Grantslast 30 patents

Charged particle beam device with dynamic focus and method of opera...

Electron beam device with dispersion compensation, and method of op...

Contamination reduction electrode for particle detector

High brightness electron gun with moving condenser lens

Multi channel detector, optics therefor and method of operating the...

Multi-axis lens, beam system making use of the compound lens, and m...

Charged particle beam device for high spatial resolution and multip...

Patents Applicationslast 30 patents

SECONDARY ELECTRON OPTICS AND DETECTION DEVICE

CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...

MULTI-BEAM SYSTEM FOR HIGH THROUGHPUT EBI

SWITCHABLE MULTI PERSPECTIVE DETECTOR, OPTICS THEREFORE AND METHOD...

ELECTRON GUN ARRANGEMENT

HIGH BRIGHTNESS ELECTRON GUN, SYSTEM USING THE SAME, AND METHOD OF...

CONTAMINATION REDUCTION ELECTRODE FOR PARTICLE DETECTOR

SECONDARY ELECTRON OPTICS AND DETECTION DEVICE

HIGH BRIGHTNESS ELECTRON GUN WITH MOVING CONDENSER LENS

CONTAMINATION REDUCTION ELECTRODE FOR PARTICLE DETECTOR

ELEMENT FOR FAST MAGNETIC BEAM DEFLECTION

MULTI CHANNEL DETECTOR, OPTICS THEREFOR AND METHOD OF OPERATING THE...

SWITCHABLE MULTI PERSPECTIVE DETECTOR, OPTICS THEREFOR AND METHOD O...

CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...

ELECTRON BEAM DEVICE WITH TILTING AND DISPERSION COMPENSATION, AND...

Trademarklast 30 trademarks