ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH

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Heimstetten, DE

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Patents Grantslast 30 patents

Information Patent Grant
Primary charged particle beam current measurement
- Patent number 11,817,292
- Issue date Nov 14, 2023
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of determining aberrations of a charged particle beam, and...
- Patent number 11,810,753
- Issue date Nov 7, 2023
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dominik Ehberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining the beam convergence of a focused charged par...
- Patent number 11,791,128
- Issue date Oct 17, 2023
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dominik Ehberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam manipulation device and method for manipulati...
- Patent number 11,705,301
- Issue date Jul 18, 2023
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration corrector and method of aligning aberration corrector
- Patent number 11,501,947
- Issue date Nov 15, 2022
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Matthias Firnkes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of influencing a charged particle beam, multipole device, an...
- Patent number 11,501,946
- Issue date Nov 15, 2022
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, multi-beamlet assembly, and method...
- Patent number 11,495,433
- Issue date Nov 8, 2022
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, scanning electron microscope, and...
- Patent number 11,469,072
- Issue date Oct 11, 2022
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device with interferometer for height measure...
- Patent number 11,257,657
- Issue date Feb 22, 2022
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- John Breuer
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and method for inspecting and/or imagi...
- Patent number 11,239,043
- Issue date Feb 1, 2022
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a charged particle gun, charged particle gun, a...
- Patent number 11,232,924
- Issue date Jan 25, 2022
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for inspecting and/or imagi...
- Patent number 11,183,361
- Issue date Nov 23, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode arrangement, contact assembly for an electrode arrangemen...
- Patent number 11,177,114
- Issue date Nov 16, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Matthias Firnkes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam blanking device for a multi-beamlet charged particle beam appa...
- Patent number 11,120,965
- Issue date Sep 14, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary charged particle imaging system
- Patent number 11,094,501
- Issue date Aug 17, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Matthias Firnkes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, objective lens module, electrode devi...
- Patent number 10,991,544
- Issue date Apr 27, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Matthias Firnkes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, interchangeable multi-aperture arrang...
- Patent number 10,978,270
- Issue date Apr 13, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method of operating a charged part...
- Patent number 10,923,313
- Issue date Feb 16, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-corrected multibeam source, charged particle beam device...
- Patent number 10,784,072
- Issue date Sep 22, 2020
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, field curvature corrector, and method...
- Patent number 10,784,070
- Issue date Sep 22, 2020
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Thomas Kemen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for operating a charged particle device with mult...
- Patent number 10,748,743
- Issue date Aug 18, 2020
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simplified particle emitter and method of operating thereof
- Patent number 10,699,867
- Issue date Jun 30, 2020
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, multi-beam blanker for a charged part...
- Patent number 10,593,509
- Issue date Mar 17, 2020
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for forming a plurality of charged particle beamlets
- Patent number 10,504,683
- Issue date Dec 10, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High performance inspection scanning electron microscope device and...
- Patent number 10,504,684
- Issue date Dec 10, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, multi-beam blanker for a charged part...
- Patent number 10,483,080
- Issue date Nov 19, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reducing coma and chromatic aberration in a charged parti...
- Patent number 10,297,418
- Issue date May 21, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, charged particle beam influencing dev...
- Patent number 10,249,472
- Issue date Apr 2, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-corrected multibeam source, charged particle beam device...
- Patent number 10,176,965
- Issue date Jan 8, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-axis illumination and alignment for charge control during charge...
- Patent number 10,168,614
- Issue date Jan 1, 2019
- Applied Materials Israel Ltd.
- Alex Goldenshtein
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...
- Publication number 20240371600
- Publication date Nov 7, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION CORRECTOR, A CHARGED PARTICLE BEAM APPARATUS, A METHOD O...
- Publication number 20240355576
- Publication date Oct 24, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Florian Lampersberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICS, CHARGED PARTICLE BEAM APPARATUS, AND METHO...
- Publication number 20240290571
- Publication date Aug 29, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A MULTIPOLE DEVICE, METHOD OF INFLUENCING AN ELEC...
- Publication number 20240274396
- Publication date Aug 15, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LENS FOR A CHARGED PARTICLE BEAM APPARATUS, CHARGED PARTICLE BEAM A...
- Publication number 20240212968
- Publication date Jun 27, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
- Publication number 20240170249
- Publication date May 23, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING A BRIGHTNESS OF A CHARGED PARTICLE BEAM, METH...
- Publication number 20240126057
- Publication date Apr 18, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC MULTIPOLE DEVICE, CHARGED PARTICLE BEAM APPARATUS, AND MET...
- Publication number 20240087837
- Publication date Mar 14, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF DETERMINING ABERRATIONS OF A CHARGED PARTICLE BEAM, AND...
- Publication number 20230352268
- Publication date Nov 2, 2023
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dominik Ehberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE, ELECTRON SOURCE FOR ELECTRON MICROSCOPE, AND M...
- Publication number 20230197399
- Publication date Jun 22, 2023
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel ADAMEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF DETERMINING ABERRATIONS OF A CHARGED PARTICLE BEAM, AND...
- Publication number 20230113857
- Publication date Apr 13, 2023
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dominik Ehberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETERMINING THE BEAM CONVERGENCE OF A FOCUSED CHARGED PAR...
- Publication number 20230116466
- Publication date Apr 13, 2023
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dominik Ehberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION CORRECTOR AND METHOD OF ALIGNING ABERRATION CORRECTOR
- Publication number 20220375713
- Publication date Nov 24, 2022
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Matthias Firnkes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING SAMPLE CH...
- Publication number 20220359152
- Publication date Nov 10, 2022
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dominik Patrick Ehberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INFLUENCING A CHARGED PARTICLE BEAM, MULTIPOLE DEVICE, AN...
- Publication number 20220277921
- Publication date Sep 1, 2022
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SCANNING ELECTRON MICROSCOPE, AND...
- Publication number 20220262592
- Publication date Aug 18, 2022
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel ADAMEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MANIPULATION DEVICE AND METHOD FOR MANIPULATI...
- Publication number 20220230836
- Publication date Jul 21, 2022
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRIMARY CHARGED PARTICLE BEAM CURRENT MEASUREMENT
- Publication number 20220208509
- Publication date Jun 30, 2022
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...
- Publication number 20210366686
- Publication date Nov 25, 2021
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...
- Publication number 20210366683
- Publication date Nov 25, 2021
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE WITH INTERFEROMETER FOR HEIGHT MEASURE...
- Publication number 20210257182
- Publication date Aug 19, 2021
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF OPERATING A CHARGED PARTICLE GUN, CHARGED PARTICLE GUN, A...
- Publication number 20210241990
- Publication date Aug 5, 2021
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM BLANKING DEVICE FOR A MULTI-BEAMLET CHARGED PARTICLE BEAM APPA...
- Publication number 20210175046
- Publication date Jun 10, 2021
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY CHARGED PARTICLE IMAGING SYSTEM
- Publication number 20210151284
- Publication date May 20, 2021
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Matthias Firnkes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, OBJECTIVE LENS MODULE, ELECTRODE DEVI...
- Publication number 20200381208
- Publication date Dec 3, 2020
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Matthias Firnkes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE
- Publication number 20200303156
- Publication date Sep 24, 2020
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR OPERATING A CHARGED PARTICLE DEVICE WITH MULT...
- Publication number 20200258714
- Publication date Aug 13, 2020
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, INTERCHANGEABLE MULTI-APERTURE ARRANG...
- Publication number 20200203116
- Publication date Jun 25, 2020
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, FIELD CURVATURE CORRECTOR, AND METHOD...
- Publication number 20200126751
- Publication date Apr 23, 2020
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Thomas Kemen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, MULTI-BEAM BLANKER FOR A CHARGED PART...
- Publication number 20200027687
- Publication date Jan 23, 2020
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin John Cook
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
74106976 - ICT
- Serial number 74106976
- Registration number 1658874
- Filing date Oct 18, 1990
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH

Organization

Patents Grantslast 30 patents

Primary charged particle beam current measurement

Methods of determining aberrations of a charged particle beam, and...

Method of determining the beam convergence of a focused charged par...

Charged particle beam manipulation device and method for manipulati...

Aberration corrector and method of aligning aberration corrector

Method of influencing a charged particle beam, multipole device, an...

Charged particle beam apparatus, multi-beamlet assembly, and method...

Charged particle beam apparatus, scanning electron microscope, and...

Charged particle beam device with interferometer for height measure...

Charged particle beam device and method for inspecting and/or imagi...

Method of operating a charged particle gun, charged particle gun, a...

Charged particle beam device and method for inspecting and/or imagi...

Electrode arrangement, contact assembly for an electrode arrangemen...

Beam blanking device for a multi-beamlet charged particle beam appa...

Secondary charged particle imaging system

Charged particle beam device, objective lens module, electrode devi...

Charged particle beam device, interchangeable multi-aperture arrang...

Charged particle beam device and method of operating a charged part...

Aberration-corrected multibeam source, charged particle beam device...

Charged particle beam device, field curvature corrector, and method...

Device and method for operating a charged particle device with mult...

Simplified particle emitter and method of operating thereof

Charged particle beam device, multi-beam blanker for a charged part...

Device and method for forming a plurality of charged particle beamlets

High performance inspection scanning electron microscope device and...

Charged particle beam device, multi-beam blanker for a charged part...

Method of reducing coma and chromatic aberration in a charged parti...

Charged particle beam device, charged particle beam influencing dev...

Aberration-corrected multibeam source, charged particle beam device...

On-axis illumination and alignment for charge control during charge...

Patents Applicationslast 30 patents

METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...

ABERRATION CORRECTOR, A CHARGED PARTICLE BEAM APPARATUS, A METHOD O...

CHARGED PARTICLE OPTICS, CHARGED PARTICLE BEAM APPARATUS, AND METHO...

METHOD OF FORMING A MULTIPOLE DEVICE, METHOD OF INFLUENCING AN ELEC...

LENS FOR A CHARGED PARTICLE BEAM APPARATUS, CHARGED PARTICLE BEAM A...

CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...

METHOD OF DETERMINING A BRIGHTNESS OF A CHARGED PARTICLE BEAM, METH...

MAGNETIC MULTIPOLE DEVICE, CHARGED PARTICLE BEAM APPARATUS, AND MET...

METHODS OF DETERMINING ABERRATIONS OF A CHARGED PARTICLE BEAM, AND...

ELECTRON MICROSCOPE, ELECTRON SOURCE FOR ELECTRON MICROSCOPE, AND M...

METHODS OF DETERMINING ABERRATIONS OF A CHARGED PARTICLE BEAM, AND...

METHOD OF DETERMINING THE BEAM CONVERGENCE OF A FOCUSED CHARGED PAR...

ABERRATION CORRECTOR AND METHOD OF ALIGNING ABERRATION CORRECTOR

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING SAMPLE CH...

METHOD OF INFLUENCING A CHARGED PARTICLE BEAM, MULTIPOLE DEVICE, AN...

CHARGED PARTICLE BEAM APPARATUS, SCANNING ELECTRON MICROSCOPE, AND...

CHARGED PARTICLE BEAM MANIPULATION DEVICE AND METHOD FOR MANIPULATI...

PRIMARY CHARGED PARTICLE BEAM CURRENT MEASUREMENT

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...

CHARGED PARTICLE BEAM DEVICE WITH INTERFEROMETER FOR HEIGHT MEASURE...

METHOD OF OPERATING A CHARGED PARTICLE GUN, CHARGED PARTICLE GUN, A...

BEAM BLANKING DEVICE FOR A MULTI-BEAMLET CHARGED PARTICLE BEAM APPA...

SECONDARY CHARGED PARTICLE IMAGING SYSTEM

CHARGED PARTICLE BEAM DEVICE, OBJECTIVE LENS MODULE, ELECTRODE DEVI...

BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE

DEVICE AND METHOD FOR OPERATING A CHARGED PARTICLE DEVICE WITH MULT...

CHARGED PARTICLE BEAM DEVICE, INTERCHANGEABLE MULTI-APERTURE ARRANG...

CHARGED PARTICLE BEAM DEVICE, FIELD CURVATURE CORRECTOR, AND METHOD...

CHARGED PARTICLE BEAM DEVICE, MULTI-BEAM BLANKER FOR A CHARGED PART...

Trademarklast 30 trademarks

74106976 - ICT