Industrial Optical Measurement Systems, LLC

Organization

  • Ann Arbor, MI, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Laser probe for use in an inspection system

    • Patent number 9,581,556
    • Issue date Feb 28, 2017
    • Industrial Optical Measurement Systems, LLC
    • Stephen Barrett Segall
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laser inspection system

    • Patent number 9,134,232
    • Issue date Sep 15, 2015
    • Industrial Optical Measurement Systems, LLC
    • Stephen Barrett Segall
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

NSF Awardslast 12 months

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NSF Awards