INOVYS CORPORATION

Organization

PLEASANTON, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Process for identifying the location of a break in a scan chain in...
- Patent number 7,568,139
- Issue date Jul 28, 2009
- INOVYS Corporation
- Richard C Dokken
- G01 - MEASURING TESTING
Information Patent Grant
Digitally controlled modular power supply for automated test equipment
- Patent number 7,154,253
- Issue date Dec 26, 2006
- INOVYS Corporation
- Andre Gunther
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
- Patent number 7,114,114
- Issue date Sep 26, 2006
- INOVYS Corporation
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automatically determining a testing order whe...
- Patent number 7,047,463
- Issue date May 16, 2006
- INOVYS Corporation
- Donald V. Organ
- G01 - MEASURING TESTING
Information Patent Grant
System for dynamic re-allocation of test pattern data for parallel...
- Patent number 7,032,145
- Issue date Apr 18, 2006
- INOVYS Corporation
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
- Patent number 7,013,417
- Issue date Mar 14, 2006
- INOVYS Corporation
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Digitally controlled modular power supply for automated test equipment
- Patent number 6,900,621
- Issue date May 31, 2005
- Inovys
- Andre Gunther
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
- Patent number 6,880,137
- Issue date Apr 12, 2005
- Inovys
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Programmable precision current controlling apparatus
- Patent number 6,859,157
- Issue date Feb 22, 2005
- INOVYS Corporation
- Andre Gunther
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems for providing zero latency, non-modulo looping and branchin...
- Patent number 6,839,648
- Issue date Jan 4, 2005
- INOVYS Corporation
- Philip D. Burlison
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable precision current controlling apparatus
- Patent number 6,750,797
- Issue date Jun 15, 2004
- INOVYS Corporation
- Andre Gunther
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems for providing zero latency, non-modulo looping and branchin...
- Patent number 6,591,213
- Issue date Jul 8, 2003
- INOVYS Corporation
- Philip D. Burlison
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OPERATING A SECURE SEMICONDUCTOR IP SERVER TO SUPPORT FA...
- Publication number 20100031092
- Publication date Feb 4, 2010
- Inovys Corporation
- RICHARD C. DOKKEN
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC MASK MEMORY FOR SERIAL SCAN TESTING
- Publication number 20090132870
- Publication date May 21, 2009
- Inovys Corporation
- PHILLIP BURLISON
- G01 - MEASURING TESTING
Information Patent Application
LOCATING HOLD TIME VIOLATIONS IN SCAN CHAINS BY GENERATING PATTERNS...
- Publication number 20090113265
- Publication date Apr 30, 2009
- Inovys Corporation
- Stephen A. Cannon
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR LOCATING A DEFECT IN A SCAN CHAIN WHILE TESTING DIGIT...
- Publication number 20080209288
- Publication date Aug 28, 2008
- Inovys Corporation
- PHIL BURLISON
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN...
- Publication number 20080141085
- Publication date Jun 12, 2008
- Inovys Corporation
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Device Performance Characterization in Physic...
- Publication number 20080126896
- Publication date May 29, 2008
- Inovys Corporation
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Application
Process for improving design limited yield by efficiently capturing...
- Publication number 20080104468
- Publication date May 1, 2008
- Inovys Corporation
- GERALD S. CHAN
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR IMPROVING DESIGN-LIMITED YIELD BY LOCALIZING POTENTIAL...
- Publication number 20080091981
- Publication date Apr 17, 2008
- Inovys Corporation
- RICHARD C. DOKKEN
- G01 - MEASURING TESTING
Information Patent Application
Method and system for delay defect location when testing digital se...
- Publication number 20050203716
- Publication date Sep 15, 2005
- Inovys Corporation
- Donald V. Organ
- G06 - COMPUTING CALCULATING COUNTING

Trademarklast 30 trademarks

Information Trademark
78271828 - FLOPPLOT
- Serial number 78271828
- Registration number 2865150
- Filing date Jul 8, 2003
- Inovys Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78146327 - STYLUS
- Serial number 78146327
- Filing date Jul 22, 2002
- Inovys Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78105540 - INOVYS
- Serial number 78105540
- Registration number 2754453
- Filing date Jan 29, 2002
- Inovys Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

INOVYS CORPORATION

Organization

Patents Grantslast 30 patents

Process for identifying the location of a break in a scan chain in...

Digitally controlled modular power supply for automated test equipment

Dynamically reconfigurable precision signal delay test system for a...

Method and system for automatically determining a testing order whe...

System for dynamic re-allocation of test pattern data for parallel...

Dynamically reconfigurable precision signal delay test system for a...

Digitally controlled modular power supply for automated test equipment

Dynamically reconfigurable precision signal delay test system for a...

Programmable precision current controlling apparatus

Systems for providing zero latency, non-modulo looping and branchin...

Programmable precision current controlling apparatus

Systems for providing zero latency, non-modulo looping and branchin...

Patents Applicationslast 30 patents

METHOD FOR OPERATING A SECURE SEMICONDUCTOR IP SERVER TO SUPPORT FA...

DYNAMIC MASK MEMORY FOR SERIAL SCAN TESTING

LOCATING HOLD TIME VIOLATIONS IN SCAN CHAINS BY GENERATING PATTERNS...

APPARATUS FOR LOCATING A DEFECT IN A SCAN CHAIN WHILE TESTING DIGIT...

PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN...

System and Method for Device Performance Characterization in Physic...

Process for improving design limited yield by efficiently capturing...

PROCESS FOR IMPROVING DESIGN-LIMITED YIELD BY LOCALIZING POTENTIAL...

Method and system for delay defect location when testing digital se...

Trademarklast 30 trademarks

78271828 - FLOPPLOT

78146327 - STYLUS

78105540 - INOVYS