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INSTITUTO NACIONAL DE METROLOGIA, QUALIDADE E TECNOLOGIA - INMETRO
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Rio de Janeiro, BR
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Patents Grants
last 30 patents
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Patent Grant
Metallic device for scanning near-field optical microscopy and spec...
Patent number
10,274,514
Issue date
Apr 30, 2019
Universidade Federal De Minas Gerais—UFMG
Thiago De Lourenço E Vasconcelos
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METALLIC DEVICE FOR SCANNING PROBE MICROSCOPY AND METHOD FOR MANUFA...
Publication number
20180372777
Publication date
Dec 27, 2018
Universidade Federal De Minas Gerais-UFMG
Thiago DE LOURENÇO E VASCONCELOS
G01 - MEASURING TESTING
Information
Patent Application
METALLIC DEVICE FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SPEC...
Publication number
20180120345
Publication date
May 3, 2018
Universidade Federal De Minas Gerais-UFMG
Thiago DE LOURENÇO E VASCONCELOS
G01 - MEASURING TESTING
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