Intec Corporation

Organization

Norwalk, CT, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Scanner detector array and light diffuser
- Patent number 5,068,523
- Issue date Nov 26, 1991
- Intec Corp.
- Alexander Adelson
- G01 - MEASURING TESTING
Information Patent Grant
Scanning apparatus
- Patent number 5,054,930
- Issue date Oct 8, 1991
- Intec, Corp.
- Alexander Adelson
- G02 - OPTICS
Information Patent Grant
Flaw annunciator with a controllable display means for an automatic...
- Patent number 5,006,722
- Issue date Apr 9, 1991
- Intec Corp.
- Alexander Adelson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optically inspecting a moving web of glass
- Patent number 4,401,893
- Issue date Aug 30, 1983
- Intec Corporation
- Andre Dehuysser
- G01 - MEASURING TESTING
Information Patent Grant
Absolute DC system for a laser inspection system
- Patent number 4,297,587
- Issue date Oct 27, 1981
- Intec Corporation
- Cole H. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Radiation inspection system for a material making apparatus and met...
- Patent number 4,289,964
- Issue date Sep 15, 1981
- Intec Corporation
- Cole H. Baker
- D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information Patent Grant
Multiple source laser scanning inspection system
- Patent number 4,265,545
- Issue date May 5, 1981
- Intec Corporation
- Frank A. Slaker
- G01 - MEASURING TESTING
Information Patent Grant
Wide web laser scanner flaw detection method and apparatus
- Patent number 4,260,899
- Issue date Apr 7, 1981
- Intec Corporation
- Cole H. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for a web edge tracking flaw detection system
- Patent number 4,247,204
- Issue date Jan 27, 1981
- Intec Corporation
- Monty M. Merlen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for a rotary scanner flaw detection system
- Patent number 3,980,891
- Issue date Sep 14, 1976
- Intec Corporation
- Frank A. Slaker
- G01 - MEASURING TESTING
Information Patent Grant
Alignment means for a flaw detection system employing a light colle...
- Patent number 3,980,893
- Issue date Sep 14, 1976
- Intec Corporation
- Monty M. Merlen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

Information Trademark
73025155 - INTEC
- Serial number 73025155
- Registration number 1017340
- Filing date Jun 24, 1974
- INTEC CORP.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Intec Corporation

Organization

Patents Grantslast 30 patents

Scanner detector array and light diffuser

Scanning apparatus

Flaw annunciator with a controllable display means for an automatic...

Method and apparatus for optically inspecting a moving web of glass

Absolute DC system for a laser inspection system

Radiation inspection system for a material making apparatus and met...

Multiple source laser scanning inspection system

Wide web laser scanner flaw detection method and apparatus

Method and apparatus for a web edge tracking flaw detection system

Method and apparatus for a rotary scanner flaw detection system

Alignment means for a flaw detection system employing a light colle...

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

73025155 - INTEC