Intekplus Co., Ltd.

Organization

Daejeon, KR

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Picker device
- Patent number 12,085,608
- Issue date Sep 10, 2024
- Intekplus Co., Ltd.
- Byeong Gwon Joo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorescence lifetime measurement device for analyzing multi-expone...
- Patent number 11,280,736
- Issue date Mar 22, 2022
- Yonsei University Industry Foundation (Yonsei UIF)
- Dug Young Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fluorescence lifetime measurement apparatus and method capable of f...
- Patent number 10,845,311
- Issue date Nov 24, 2020
- Yonsei University Industry Foundation (Yonsei UIF)
- Dug Young Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring fluorescence lifetime
- Patent number 10,753,872
- Issue date Aug 25, 2020
- Intekplus Co., Ltd.
- Sang Yoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting flat panel
- Patent number 9,412,159
- Issue date Aug 9, 2016
- Intekplus Co., Ltd.
- Jai-Ho Son
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and device for transmitting/receiving image data at high speed
- Patent number 9,218,050
- Issue date Dec 22, 2015
- INTEKPLUS CO., LTD.
- Min-Gu Kang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three-dimensional shape measuring apparatus
- Patent number 8,493,570
- Issue date Jul 23, 2013
- Intekplus Co., Ltd.
- Joon-Ho You
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to perform a non-contact test of a semiconductor package
- Patent number 8,319,961
- Issue date Nov 27, 2012
- Samsung Electronics Co., Ltd.
- Chang-Hyun Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measuring system and surface shape measuring method u...
- Patent number 8,259,305
- Issue date Sep 4, 2012
- Intekplus Co., Ltd.
- Sang-yun Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of measuring image
- Patent number 8,155,483
- Issue date Apr 10, 2012
- Intekplus Co., Ltd.
- Sang-yoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Tray handling apparatus and semiconductor device inspecting method...
- Patent number 8,056,698
- Issue date Nov 15, 2011
- Intekplus Co., Ltd.
- Ssang-geun Im
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM FOR ROLL-TO-ROLL EQUIPMENT
- Publication number 20240284054
- Publication date Aug 22, 2024
- Intekplus Co., Ltd.
- Sung Yong KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PICKER DEVICE
- Publication number 20230152368
- Publication date May 18, 2023
- Intekplus Co., Ltd.
- Byeong Gwon JOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CONFIRMING MOUNTED STATE OF PICKER MOUNTS
- Publication number 20230144924
- Publication date May 11, 2023
- Intekplus Co., Ltd.
- Byeong Gwon JOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLUORESCENCE LIFETIME MEASUREMENT DEVICE FOR ANALYZING MULTI-EXPONE...
- Publication number 20200088638
- Publication date Mar 19, 2020
- YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF)
- Dug Young KIM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE
- Publication number 20200080838
- Publication date Mar 12, 2020
- INTEKPLUS CO.,LTD.
- Sang Yoon LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING FLUORESCENCE LIFETIME
- Publication number 20190383740
- Publication date Dec 19, 2019
- INTEKPLUS CO.,LTD.
- Sang Yoon LEE
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE LIFETIME MEASUREMENT APPARATUS AND METHOD CAPABLE OF F...
- Publication number 20190310198
- Publication date Oct 10, 2019
- YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF)
- Dug Young KIM
- G01 - MEASURING TESTING
Information Patent Application
TISSUE ABLATION SYSTEM
- Publication number 20180317999
- Publication date Nov 8, 2018
- Intekplus Co., Ltd.
- Sung-Soo PARK
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF QUANTIFYING BIOMARKER WITH HIGH SENSITIVITY USING PHOTO-O...
- Publication number 20180180621
- Publication date Jun 28, 2018
- INTEKPLUS CO., LTD.
- Ji Yoon KANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING FLAT PANEL
- Publication number 20140226004
- Publication date Aug 14, 2014
- Intekplus Co., Ltd.
- Jai-Ho Son
- G02 - OPTICS
Information Patent Application
METHOD AND DEVICE FOR TRANSMITTING/RECEIVING IMAGE DATA AT HIGH SPEED
- Publication number 20130176443
- Publication date Jul 11, 2013
- INTEKPLUS CO., LTD
- Min-Gu Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS
- Publication number 20100265517
- Publication date Oct 21, 2010
- Intekplus Co., Ltd.
- Joon-Ho You
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING SYSTEM AND SURFACE SHAPE MEASURING METHOD U...
- Publication number 20100259765
- Publication date Oct 14, 2010
- Intekplus Co., Ltd.
- Sang-yun Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE
- Publication number 20100171963
- Publication date Jul 8, 2010
- Intekplus Co., Ltd.
- Sang-yun Lee
- G01 - MEASURING TESTING
Information Patent Application
TRAY HANDLING APPARATUS AND SEMICONDUCTOR DEVICE INSPECTING METHOD...
- Publication number 20100032262
- Publication date Feb 11, 2010
- Intekplus Co., Ltd.
- Ssang-geun Im
- G01 - MEASURING TESTING
Information Patent Application
Apparatus For and Method of Measuring Image
- Publication number 20080260204
- Publication date Oct 23, 2008
- Intekplus Co., Ltd.
- Sang-yoon Lee
- G01 - MEASURING TESTING

Intekplus Co., Ltd.

Organization

Patents Grantslast 30 patents

Picker device

Fluorescence lifetime measurement device for analyzing multi-expone...

Fluorescence lifetime measurement apparatus and method capable of f...

Apparatus and method for measuring fluorescence lifetime

Method for inspecting flat panel

Method and device for transmitting/receiving image data at high speed

Three-dimensional shape measuring apparatus

Apparatus to perform a non-contact test of a semiconductor package

Surface shape measuring system and surface shape measuring method u...

Apparatus for and method of measuring image

Tray handling apparatus and semiconductor device inspecting method...

Patents Applicationslast 30 patents

INSPECTION SYSTEM FOR ROLL-TO-ROLL EQUIPMENT

PICKER DEVICE

SYSTEM AND METHOD FOR CONFIRMING MOUNTED STATE OF PICKER MOUNTS

FLUORESCENCE LIFETIME MEASUREMENT DEVICE FOR ANALYZING MULTI-EXPONE...

APPARATUS AND METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE

APPARATUS AND METHOD FOR MEASURING FLUORESCENCE LIFETIME

FLUORESCENCE LIFETIME MEASUREMENT APPARATUS AND METHOD CAPABLE OF F...

TISSUE ABLATION SYSTEM

METHOD OF QUANTIFYING BIOMARKER WITH HIGH SENSITIVITY USING PHOTO-O...

METHOD FOR INSPECTING FLAT PANEL

METHOD AND DEVICE FOR TRANSMITTING/RECEIVING IMAGE DATA AT HIGH SPEED

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS

SURFACE SHAPE MEASURING SYSTEM AND SURFACE SHAPE MEASURING METHOD U...

APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE

TRAY HANDLING APPARATUS AND SEMICONDUCTOR DEVICE INSPECTING METHOD...

Apparatus For and Method of Measuring Image