INTERCONNECT DEVICES, INC

Organization

  • ST. DAVIDS, PA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe with contact ring

    • Patent number 7,362,118
    • Issue date Apr 22, 2008
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Eccentric offset Kelvin probe

    • Patent number 7,298,153
    • Issue date Nov 20, 2007
    • Interconnect Devices, Inc.
    • Jason W. Farris
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

  • Information Trademark

    77068714 - XACT

    • Serial number 77068714
    • Filing date Dec 20, 2006
    • Interconnect Devices, Inc.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments