INTERNATIONAL PRECISION INCORPORATED, A CORP. OF JAPAN

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HACHIOHJI-SHI, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam apparatus with improved specimen holder
- Patent number 4,596,934
- Issue date Jun 24, 1986
- International Precision Inc.
- Takashi Yanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 4,434,367
- Issue date Feb 28, 1984
- International Precision Incorporated
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 4,429,222
- Issue date Jan 31, 1984
- International Precision Incorporated
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope of scanning type
- Patent number 4,426,577
- Issue date Jan 17, 1984
- International Precision Incorporated
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens for electron microscope
- Patent number 4,383,176
- Issue date May 10, 1983
- International Precision Incorporated
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of photographing electron microscope images on a single phot...
- Patent number 4,316,087
- Issue date Feb 16, 1982
- International Precision Incorporated
- Takashi Yanaka
- H01 - BASIC ELECTRIC ELEMENTS

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