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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device test system having high fidelity tester access...
- Patent number 8,446,164
- Issue date May 21, 2013
- International Trading & Technology Co., Ltd.
- Kyung-hun Chang
- G01 - MEASURING TESTING
Information Patent Grant
Multiply apparatus for semiconductor test pattern signal
- Patent number 8,340,940
- Issue date Dec 25, 2012
- International Trading & Technology Co., Ltd.
- Kyung-hun Chang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE TEST SYSTEM
- Publication number 20110018572
- Publication date Jan 27, 2011
- INTERNATIONAL TRADING & TECHNOLOGY CO., LTD.
- Kyung-hun Chang
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLY APPARATUS FOR SEMICONDUCTOR TEST PATTERN SIGNAL
- Publication number 20100262397
- Publication date Oct 14, 2010
- INTERNATIONAL TRADING & TECHNOLOGY CO., LTD.
- Kyung-hun Chang
- G01 - MEASURING TESTING

Trademarklast 30 trademarks