IOFFE PHYSICAL TECHNICAL INSTITUTE

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St. Petersburg, RU

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Patents Grantslast 30 patents

Information Patent Grant
Characterization apparatus for characterizing scintillator material
- Patent number 10,101,471
- Issue date Oct 16, 2018
- Koninklijke Philips N.V.
- Herfried Karl Wieczorek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZATION APPARATUS FOR CHARACTERIZING SCINTILLATOR MATERIAL
- Publication number 20170205515
- Publication date Jul 20, 2017
- Koninklijke Philips N.V.
- Herfried Karl WIECZOREK
- G01 - MEASURING TESTING

Trademarklast 30 trademarks