IONWERKS, INC

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HOUSTON, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 11,391,681
- Issue date Jul 19, 2022
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 10,876,982
- Issue date Dec 29, 2020
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 10,446,383
- Issue date Oct 15, 2019
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Inorganic nanoparticle matrices for sample analysis
- Patent number 10,191,028
- Issue date Jan 29, 2019
- Ionwerks
- John Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 9,297,761
- Issue date Mar 29, 2016
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight spectrometry and spectroscopy of surfaces
- Patent number 8,829,428
- Issue date Sep 9, 2014
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Nonoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 8,614,416
- Issue date Dec 24, 2013
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Post-ionization of neutrals for ion mobility oTOFMS identification...
- Patent number 8,558,168
- Issue date Oct 15, 2013
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometry of surfaces
- Patent number 8,519,329
- Issue date Aug 27, 2013
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 8,492,710
- Issue date Jul 23, 2013
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post-ionization of neutrals for ion mobility oTOFMS identification...
- Patent number 8,384,023
- Issue date Feb 26, 2013
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Neutral/ion reactor in adiabatic supersonic gas flow for ion mobili...
- Patent number 8,129,675
- Issue date Mar 6, 2012
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam ion mobility time-of-flight mass spectrometry with multi...
- Patent number 8,115,167
- Issue date Feb 14, 2012
- Ionwerks, Inc.
- Valeri V. Raznikov
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometry of surfaces
- Patent number 8,101,909
- Issue date Jan 24, 2012
- Ionwerks, Inc.
- Thomas F. Egan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved dynamic range
- Patent number 7,800,054
- Issue date Sep 21, 2010
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplex data acquisition modes for ion mobility-mass spectrometry
- Patent number 7,745,780
- Issue date Jun 29, 2010
- Ionwerks, Inc.
- John A. McLean
- G01 - MEASURING TESTING
Information Patent Grant
Gold implantation/deposition of biological samples for laser desorp...
- Patent number 7,629,576
- Issue date Dec 8, 2009
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Neutral/Ion reactor in adiabatic supersonic gas flow for ion mobili...
- Patent number 7,547,878
- Issue date Jun 16, 2009
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam ion mobility time-of-flight mass spectrometry with multi...
- Patent number 7,482,582
- Issue date Jan 27, 2009
- Ionwerks, Inc.
- Valeri V. Raznikov
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam ion mobility time-of-flight mass spectrometer with bipol...
- Patent number 7,429,729
- Issue date Sep 30, 2008
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Multiplex data acquisition modes for ion mobility-mass spectrometry
- Patent number 7,388,197
- Issue date Jun 17, 2008
- Ionwerks, Inc.
- John A. McLean
- G01 - MEASURING TESTING
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 7,365,313
- Issue date Apr 29, 2008
- Ionwerks
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 7,291,834
- Issue date Nov 6, 2007
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility TOF/MALDI/MS using drift cell alternating high and low...
- Patent number 7,223,969
- Issue date May 29, 2007
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
MALDI-IM-ortho-TOF mass spectrometry with simultaneous positive and...
- Patent number 7,170,052
- Issue date Jan 30, 2007
- Ionwerks, Inc.
- Hiroshi Furutani
- G01 - MEASURING TESTING
Information Patent Grant
Ion mobility spectrometer
- Patent number 7,164,122
- Issue date Jan 16, 2007
- Ionwerks, Inc.
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 7,145,134
- Issue date Dec 5, 2006
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 7,084,393
- Issue date Aug 1, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,084,395
- Issue date Aug 1, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas-phase purification of biomolecules by ion mobility for patterni...
- Patent number 7,081,617
- Issue date Jul 25, 2006
- Ionwerks, Inc.
- John A. McLean
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20220404298
- Publication date Dec 22, 2022
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20210116402
- Publication date Apr 22, 2021
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20200013606
- Publication date Jan 9, 2020
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20170221691
- Publication date Aug 3, 2017
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20160189942
- Publication date Jun 30, 2016
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nanoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
- Publication number 20140084153
- Publication date Mar 27, 2014
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
POST-IONIZATION OF NEUTRALS FOR ION MOBILITY oTOFMS IDENTIFICATION...
- Publication number 20130134305
- Publication date May 30, 2013
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACE
- Publication number 20120085898
- Publication date Apr 12, 2012
- Ionwerks, Inc.
- Thomas F. Egan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
- Publication number 20120018630
- Publication date Jan 26, 2012
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT SPECTROMETRY AND SPECTROSCOPY OF SURFACES
- Publication number 20110147578
- Publication date Jun 23, 2011
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DATA ACQUISITIO...
- Publication number 20110049355
- Publication date Mar 3, 2011
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GOLD IMPLANTATION/DEPOSITION OF BIOLOGICAL SAMPLES FOR LASER DESORP...
- Publication number 20100090101
- Publication date Apr 15, 2010
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES
- Publication number 20090189072
- Publication date Jul 30, 2009
- Ionwerks, Inc.
- Thomas F. Egan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE
- Publication number 20090008545
- Publication date Jan 8, 2009
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20070018113
- Publication date Jan 25, 2007
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-beam ion mobility time-of-flight mass spectrometer with bipol...
- Publication number 20060289747
- Publication date Dec 28, 2006
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
Ion mobility TOF/MALDI/MS using drift cell alternating high and low...
- Publication number 20060192104
- Publication date Aug 31, 2006
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
Gold implantation/deposition of biological samples for laser desorp...
- Publication number 20050035284
- Publication date Feb 17, 2005
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Publication number 20050006577
- Publication date Jan 13, 2005
- IONWERKS
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20040217275
- Publication date Nov 4, 2004
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20040046117
- Publication date Mar 11, 2004
- IONWERKS
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20030111597
- Publication date Jun 19, 2003
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS

IONWERKS, INC

Organization

Patents Grantslast 30 patents

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Inorganic nanoparticle matrices for sample analysis

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Time-of-flight spectrometry and spectroscopy of surfaces

Nonoparticulate assisted nanoscale molecular imaging by mass spectr...

Post-ionization of neutrals for ion mobility oTOFMS identification...

Time-of-flight mass spectrometry of surfaces

Fast time-of-flight mass spectrometer with improved data acquisitio...

Post-ionization of neutrals for ion mobility oTOFMS identification...

Neutral/ion reactor in adiabatic supersonic gas flow for ion mobili...

Multi-beam ion mobility time-of-flight mass spectrometry with multi...

Time-of-flight mass spectrometry of surfaces

Fast time-of-flight mass spectrometer with improved dynamic range

Multiplex data acquisition modes for ion mobility-mass spectrometry

Gold implantation/deposition of biological samples for laser desorp...

Neutral/Ion reactor in adiabatic supersonic gas flow for ion mobili...

Multi-beam ion mobility time-of-flight mass spectrometry with multi...

Multi-beam ion mobility time-of-flight mass spectrometer with bipol...

Multiplex data acquisition modes for ion mobility-mass spectrometry

Fast time-of-flight mass spectrometer with improved data acquisitio...

Multi-anode detector with increased dynamic range for time-of-fligh...

Ion mobility TOF/MALDI/MS using drift cell alternating high and low...

MALDI-IM-ortho-TOF mass spectrometry with simultaneous positive and...

Ion mobility spectrometer

Multi-anode detector with increased dynamic range for time-of-fligh...

Fast time-of-flight mass spectrometer with improved data acquisitio...

Time-of-flight mass spectrometer for monitoring of fast processes

Gas-phase purification of biomolecules by ion mobility for patterni...

Patents Applicationslast 30 patents

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

Nanoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...

POST-IONIZATION OF NEUTRALS FOR ION MOBILITY oTOFMS IDENTIFICATION...

TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACE

Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...

TIME-OF-FLIGHT SPECTROMETRY AND SPECTROSCOPY OF SURFACES

FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DATA ACQUISITIO...

GOLD IMPLANTATION/DEPOSITION OF BIOLOGICAL SAMPLES FOR LASER DESORP...

TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES

FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE

Multi-anode detector with increased dynamic range for time-of-fligh...

Multi-beam ion mobility time-of-flight mass spectrometer with bipol...

Ion mobility TOF/MALDI/MS using drift cell alternating high and low...

Gold implantation/deposition of biological samples for laser desorp...

Fast time-of-flight mass spectrometer with improved data acquisitio...

Multi-anode detector with increased dynamic range for time-of-fligh...

Multi-anode detector with increased dynamic range for time-of-fligh...

Multi-anode detector with increased dynamic range for time-of-fligh...

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