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Ipec Precision, Inc.
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Bethel, CT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method to remove station-induced error pattern from measured object...
Patent number
6,275,770
Issue date
Aug 14, 2001
IPEC Precision Inc.
Azat M. Latypov
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for moving an article relative to and between...
Patent number
6,242,926
Issue date
Jun 5, 2001
Ipec Precision, Inc.
George J. Gardopee
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for plasma jet treatment of substrates
Patent number
6,105,534
Issue date
Aug 22, 2000
Ipec Precision, Inc.
Oleg Siniaguine
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Non-contact holder for wafer-like articles
Patent number
6,099,056
Issue date
Aug 8, 2000
Ipec Precision, Inc.
Oleg Siniaguine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for generating and deflecting a plasma jet
Patent number
6,040,548
Issue date
Mar 21, 2000
Ipec Precision, Inc.
Oleg Siniaguine
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Apparatus for providing consistent, non-jamming registration of not...
Patent number
5,700,297
Issue date
Dec 23, 1997
Ipec Precision, Inc.
Joseph F. Vollaro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Localized plasma assisted chemical etching through a mask
Patent number
5,688,415
Issue date
Nov 18, 1997
Ipec Precision, Inc.
David Bollinger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Trademark
last 30 trademarks