ISEMICON, INC.

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Daejeon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring number of yield loss chips and number of poor...
- Patent number 6,714,885
- Issue date Mar 30, 2004
- Isemicon, Inc.
- Jae-keun Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Statistic Analysis of Fault Detection and Classification in Semicon...
- Publication number 20080262771
- Publication date Oct 23, 2008
- ISEMICON, INC.
- Heung Seob Koo
- G05 - CONTROLLING REGULATING

Trademarklast 30 trademarks