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Patents Grants
last 30 patents
Information
Patent Grant
Retarding potential type energy analyzer
Patent number
10,319,578
Issue date
Jun 11, 2019
Japan Synchrotron Radiation Research Institute
Takayuki Muro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for measuring powder x-ray diffraction data using one-or-two...
Patent number
6,813,338
Issue date
Nov 2, 2004
Japan Synchrotron Radiation Research Institute
Masaki Takata
G01 - MEASURING TESTING
Information
Patent Grant
Pinhole disk laminate and a process for producing the same
Patent number
6,786,393
Issue date
Sep 7, 2004
Japan Synchrotron Radiation Research Institute
Mitsuhiro Awaji
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Patents Applications
last 30 patents
Information
Patent Application
RETARDING POTENTIAL TYPE ENERGY ANALYZER
Publication number
20180082829
Publication date
Mar 22, 2018
JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE
Takayuki MURO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETERMINING ELEMENTAL CONCENTRATION USING COMPTON SCATTERING
Publication number
20150204803
Publication date
Jul 23, 2015
Northeastern University
Arun Bansil
G01 - MEASURING TESTING
Information
Patent Application
MUTANT RAS POLYPEPTIDE CRYSTAL
Publication number
20120142116
Publication date
Jun 7, 2012
JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE
Tohru Kataoka
C30 - CRYSTAL GROWTH
Information
Patent Application
Rapid X-ray diffraction method for structural analysis of a nano ma...
Publication number
20060032433
Publication date
Feb 16, 2006
Japan Synchrotron Radiation Research Institute
Osami Sakata
G01 - MEASURING TESTING
Information
Patent Application
Method for measuring powder x-ray diffraction data using one-or-two...
Publication number
20030091147
Publication date
May 15, 2003
Japan Synchrotron Radiation Research Institute
Masaki Takata
G01 - MEASURING TESTING
Information
Patent Application
Pinhole disk laminate and a process for producing the same
Publication number
20020104871
Publication date
Aug 8, 2002
Japan Synchrotron Radiation Research Institute
Mitsuhiro Awaji
G02 - OPTICS
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