JENOPTIK JENA G.M.B.H.

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JENA, DD

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for thermowave analysis
- Patent number 5,206,710
- Issue date Apr 27, 1993
- JENOPTIK JENA G.m.b.H.
- Hans-Dieter Geiler
- G01 - MEASURING TESTING
Information Patent Grant
Device for adjustably setting up an aerial photograph measuring cha...
- Patent number 5,180,127
- Issue date Jan 19, 1993
- Jenoptik Jena G.m.b.H.
- Heinrich Klose
- G12 - INSTRUMENT DETAILS
Information Patent Grant
Modular illumination equipment
- Patent number 5,136,429
- Issue date Aug 4, 1992
- JENOPTIK JENA G.m.b.H.
- Joachim Bergner
- G02 - OPTICS
Information Patent Grant
Microscope stand
- Patent number 5,127,614
- Issue date Jul 7, 1992
- Jenoptik Jena G.m.b.H.
- Christfried Etzold
- G02 - OPTICS
Information Patent Grant
Electrolyte for producing conversion coatings
- Patent number 5,094,727
- Issue date Mar 10, 1992
- JENOPTIK JENA G.m.b.H.
- Thomas Schwarz
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Black surface layer on light metal
- Patent number 5,075,178
- Issue date Dec 24, 1991
- JENOPTIK JENA G.m.b.H.
- Juergen Schmidt
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Wide-angle objective
- Patent number 5,056,901
- Issue date Oct 15, 1991
- JENOPTIK JENA G.m.b.H.
- Gerd Rieche
- G02 - OPTICS
Information Patent Grant
Electrolyte for the production of black surface layers on light metals
- Patent number 5,035,781
- Issue date Jul 30, 1991
- JENOPTIK JENA G.m.b.H.
- Jurgen Schmidt
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
System bus expansion for coupling multimaster-capable multicomputer...
- Patent number 5,006,981
- Issue date Apr 9, 1991
- Jenoptik Jena G.m.b.H.
- Dietmar Beltz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and arrangement for background compensation in material anal...
- Patent number 4,979,823
- Issue date Dec 25, 1990
- JENOPTIK JENA G.m.b.H.
- Joachim Mohr
- G01 - MEASURING TESTING
Information Patent Grant
Achromatic phase retarder arrangement
- Patent number 4,930,878
- Issue date Jun 5, 1990
- Jenoptik Jena G.m.b.H.
- Joachim Bergner
- G02 - OPTICS
Information Patent Grant
Method for the simultaneous analysis of several elements
- Patent number 4,900,149
- Issue date Feb 13, 1990
- Jenoptik Jena G.m.b.H.
- Joachim Mohr
- G01 - MEASURING TESTING
Information Patent Grant
Write-read circuit
- Patent number 4,879,684
- Issue date Nov 7, 1989
- Jenoptik Jena G.m.b.H.
- Mathias Krauss
- G11 - INFORMATION STORAGE
Information Patent Grant
Geodetic instrument
- Patent number 4,869,590
- Issue date Sep 26, 1989
- Jenoptik Jena, GmbH
- Wieland Feist
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable echelle spectrometer arrangement and method for its adju...
- Patent number 4,856,898
- Issue date Aug 15, 1989
- Jenoptik Jena G.m.b.H.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Controlled CMOS substrate voltage generator
- Patent number 4,843,256
- Issue date Jun 27, 1989
- Jenoptik Jena G.m.b.H.
- Andreas Scade
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for the phase synchronization of step-drive controlled equip...
- Patent number 4,833,385
- Issue date May 23, 1989
- Jenoptik Jena G.m.b.H.
- Winfried Heinrich
- G01 - MEASURING TESTING
Information Patent Grant
Method for the phase synchronization of step-drive controlled equip...
- Patent number 4,831,319
- Issue date May 16, 1989
- Jenoptik Jena G.m.b.H.
- Winfried Heinrich
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for electrothermal atomization
- Patent number 4,826,318
- Issue date May 2, 1989
- Jenoptik Jena G.m.b.H.
- Horst Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for the graphic representation and analysis of fluorescen...
- Patent number 4,786,170
- Issue date Nov 22, 1988
- Jenoptik Jena G.m.b.H.
- Bernhard Groebler
- G01 - MEASURING TESTING
Information Patent Grant
Projector for projecting fixed star
- Patent number 4,776,666
- Issue date Oct 11, 1988
- Jenoptik Jena G.m.b.H.
- Gebhard Kuehn
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Apparatus for the positioning of ends of flexible light-conducting...
- Patent number 4,759,598
- Issue date Jul 26, 1988
- Jenoptik Jena G.m.b.H.
- Joachim Mohr
- G02 - OPTICS
Information Patent Grant
Method for the determination and indication of the supply of film i...
- Patent number 4,758,851
- Issue date Jul 19, 1988
- Jenoptik Jena G.m.b.H.
- Ulrich Zeth
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device for synchronous modulation, synchronous light-path switch-ov...
- Patent number 4,739,167
- Issue date Apr 19, 1988
- Jenoptik Jena G.m.b.H.
- Heinz Riegler
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus for analyzing two-dimensional input objects
- Patent number 4,735,487
- Issue date Apr 5, 1988
- Jenoptik Jena G.m.b.H.
- Gunter Thorwirth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and arrangement for the automatic control of aerial photogra...
- Patent number 4,734,724
- Issue date Mar 29, 1988
- Jenoptik Jena G.m.b.H.
- Thomas Braunschweig
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and arrangement for multielement analyse
- Patent number 4,711,572
- Issue date Dec 8, 1987
- Jenoptik Jena G.m.b.H.
- Winfried Quillfeldt
- G01 - MEASURING TESTING
Information Patent Grant
Laser spectral fluorometer
- Patent number 4,691,110
- Issue date Sep 1, 1987
- Jenoptik Jena G.m.b.H.
- Wolfgang Nebe
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for spectral analysis devices
- Patent number 4,690,559
- Issue date Sep 1, 1987
- Jenoptik Jena G.m.b.H.
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for electrothermal atomization of a sample material
- Patent number 4,660,976
- Issue date Apr 28, 1987
- Jenoptik Jena G.m.b.H.
- Heinz Falk
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
72198957 - JJ
- Serial number 72198957
- Registration number 791787
- Filing date Jul 31, 1964
- JENOPTIK JENA G.M.B.H.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
72197586 - JENOPTIK
- Serial number 72197586
- Registration number 791785
- Filing date Jul 10, 1964
- JENOPTIK JENA G.M.B.H.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

JENOPTIK JENA G.M.B.H.

Organization

Patents Grantslast 30 patents

Method and apparatus for thermowave analysis

Device for adjustably setting up an aerial photograph measuring cha...

Modular illumination equipment

Microscope stand

Electrolyte for producing conversion coatings

Black surface layer on light metal

Wide-angle objective

Electrolyte for the production of black surface layers on light metals

System bus expansion for coupling multimaster-capable multicomputer...

Method and arrangement for background compensation in material anal...

Achromatic phase retarder arrangement

Method for the simultaneous analysis of several elements

Write-read circuit

Geodetic instrument

Adjustable echelle spectrometer arrangement and method for its adju...

Controlled CMOS substrate voltage generator

Method for the phase synchronization of step-drive controlled equip...

Method for the phase synchronization of step-drive controlled equip...

Apparatus for electrothermal atomization

Apparatus for the graphic representation and analysis of fluorescen...

Projector for projecting fixed star

Apparatus for the positioning of ends of flexible light-conducting...

Method for the determination and indication of the supply of film i...

Device for synchronous modulation, synchronous light-path switch-ov...

Optical apparatus for analyzing two-dimensional input objects

Method and arrangement for the automatic control of aerial photogra...

Method and arrangement for multielement analyse

Laser spectral fluorometer

Optical system for spectral analysis devices

Method and device for electrothermal atomization of a sample material

Trademarklast 30 trademarks

72198957 - JJ

72197586 - JENOPTIK