JENOPTIK Mikrotechnik GmbH

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Reflectometer arrangement and method for determining the reflectanc...
- Patent number 6,856,395
- Issue date Feb 15, 2005
- AIXUV GmbH
- Rainer Lebert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Arrangement for determining the spectral reflectivity of a measurem...
- Publication number 20040062350
- Publication date Apr 1, 2004
- JENOPTIK Mikrotechnik GmbH
- Max Christian Schuermann
- G01 - MEASURING TESTING

Trademarklast 30 trademarks