JENTEK SENSORS INC

Organization

WALTHAM, MA, US

Business Address
110-1 CLEMATIS AVENUE WALTHAM MA 02453 781 6429666
State Location
MA
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
System and method for hole inspection
- Patent number 12,061,169
- Issue date Aug 13, 2024
- JENTEK Sensors, Inc.
- Todd Dunford
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement of material condition
- Patent number 11,959,880
- Issue date Apr 16, 2024
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method of use
- Patent number 11,841,245
- Issue date Dec 12, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Segmented field eddy current sensing for dispersive property measur...
- Patent number 11,802,851
- Issue date Oct 31, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
In-process quality assessment for additive manufacturing
- Patent number 11,747,304
- Issue date Sep 5, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Measurement system and method of use
- Patent number 11,549,831
- Issue date Jan 10, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
In-process quality assessment for additive manufacturing
- Patent number 11,543,388
- Issue date Jan 3, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Complex part inspection with eddy current sensors
- Patent number 11,435,317
- Issue date Sep 6, 2022
- JENTEK Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Segmented field eddy current sensing for dispersive property measur...
- Patent number 11,268,931
- Issue date Mar 8, 2022
- JENTEK Sensors, Inc.
- Neil J Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
In-process quality assessment for additive manufacturing
- Patent number 11,268,933
- Issue date Mar 8, 2022
- Jentek Sensors, Inc.
- Neil J. Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Method and apparatus for measurement of material condition
- Patent number 11,092,571
- Issue date Aug 17, 2021
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of corrosion and other defects...
- Patent number 10,732,096
- Issue date Aug 4, 2020
- Jentek Sensors, Inc.
- Scott A. Denenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated sensor cartridge system and method of use
- Patent number 10,677,756
- Issue date Jun 9, 2020
- Jentek Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-destructive evaluation of materials
- Patent number 10,444,189
- Issue date Oct 15, 2019
- JENTEK Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method of use
- Patent number 10,416,118
- Issue date Sep 17, 2019
- JENTEK Sensors, Inc.
- Neil J Goldfine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Portable test instrument
- Patent number D857534
- Issue date Aug 27, 2019
- JENTEK Sensors, Inc.
- Todd M Dunford
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Method and apparatus for measurement of material condition
- Patent number 10,324,062
- Issue date Jun 18, 2019
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Performance curve generation for non-destructive testing sensors
- Patent number 10,001,457
- Issue date Jun 19, 2018
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of corrosion and other defects...
- Patent number 9,823,179
- Issue date Nov 21, 2017
- Jentek Sensors, Inc.
- Scott A. Denenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for non-destructive evaluation of materials
- Patent number 9,772,309
- Issue date Sep 26, 2017
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Durability enhanced and redundant embedded sensors
- Patent number 9,279,784
- Issue date Mar 8, 2016
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of corrosion and other defects...
- Patent number 9,255,875
- Issue date Feb 9, 2016
- Jentek Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for load and additional property measurement
- Patent number 9,207,131
- Issue date Dec 8, 2015
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Internal material condition monitoring for control
- Patent number 8,981,018
- Issue date Mar 17, 2015
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for detection and characterization of mechanic...
- Patent number 8,960,012
- Issue date Feb 24, 2015
- Jentek Sensors, Inc.
- Todd M. Dunford
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-destructive evaluation of materials
- Patent number 8,928,316
- Issue date Jan 6, 2015
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Durability enhanced and redundant embedded sensors
- Patent number 8,803,515
- Issue date Aug 12, 2014
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Remaining life prediction for individual components from sparse data
- Patent number 8,768,657
- Issue date Jul 1, 2014
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Component adaptive life management
- Patent number 8,494,810
- Issue date Jul 23, 2013
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G07 - CHECKING-DEVICES
Information Patent Grant
Method for stress assessment that removes temperature effects and h...
- Patent number 8,415,947
- Issue date Apr 9, 2013
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning System and Method for Axial Symmetric Test Objects
- Publication number 20240377360
- Publication date Nov 14, 2024
- JENTEK Sensors, Inc.
- Todd M Dunford
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20240255323
- Publication date Aug 1, 2024
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
In-Process Quality Assessment for Additive Manufacturing
- Publication number 20230408449
- Publication date Dec 21, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20230160728
- Publication date May 25, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
In-Process Quality Assessment for Additive Manufacturing
- Publication number 20230152278
- Publication date May 18, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Application
SEGMENTED FIELD EDDY CURRENT SENSING FOR DISPERSIVE PROPERTY MEASUR...
- Publication number 20230095662
- Publication date Mar 30, 2023
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Application
COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS
- Publication number 20220412918
- Publication date Dec 29, 2022
- JENTEK Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20220373367
- Publication date Nov 24, 2022
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR PIT DETECTION AND SIZING
- Publication number 20220358630
- Publication date Nov 10, 2022
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR HOLE INSPECTION
- Publication number 20220341876
- Publication date Oct 27, 2022
- JENTEK Sensors, Inc.
- Todd Dunford
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HOLE INSPECTION AND QUALIFICATION
- Publication number 20220341875
- Publication date Oct 27, 2022
- JENTEK Sensors, Inc.
- Stuart Chaplan
- G01 - MEASURING TESTING
Information Patent Application
In-Process Quality Assessment for Additive Manufacturing
- Publication number 20220178877
- Publication date Jun 9, 2022
- JENTEK Sensors, Inc.
- Neil J Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Method and Apparatus for Measurement of Material Condition
- Publication number 20210372968
- Publication date Dec 2, 2021
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20210080297
- Publication date Mar 18, 2021
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS
- Publication number 20210055262
- Publication date Feb 25, 2021
- JENTEK Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Segmented Field Eddy Current Sensing for Dispersive Property Measur...
- Publication number 20190383771
- Publication date Dec 19, 2019
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Method and Apparatus for Measurement of Material Condition
- Publication number 20190323992
- Publication date Oct 24, 2019
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
IN SITU ADDITIVE MANUFACTURING PROCESS SENSING AND CONTROL INCLUDIN...
- Publication number 20180264590
- Publication date Sep 20, 2018
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
Method And Apparatus For Inspection Of Corrosion And Other Defects...
- Publication number 20180209894
- Publication date Jul 26, 2018
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
In-Process Quality Assessment for Additive Manufacturing
- Publication number 20180120260
- Publication date May 3, 2018
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR NON-DESTRUCTIVE EVALUATION OF MATERIALS
- Publication number 20170315095
- Publication date Nov 2, 2017
- JENTEK Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USE
- Publication number 20160349214
- Publication date Dec 1, 2016
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measurement of Material Condition
- Publication number 20160274060
- Publication date Sep 22, 2016
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF CORROSION AND OTHER DEFECTS...
- Publication number 20160238514
- Publication date Aug 18, 2016
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Non-Destructive Evaluation of Materials
- Publication number 20150212044
- Publication date Jul 30, 2015
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL
- Publication number 20150160144
- Publication date Jun 11, 2015
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Durability Enhanced And Redundant Embedded Sensors
- Publication number 20150145510
- Publication date May 28, 2015
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Detection and Characterization of Mechanic...
- Publication number 20140182389
- Publication date Jul 3, 2014
- JENTEK Sensors, Inc.
- Todd M. Dunford
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Inspection of Corrosion and Other Defects...
- Publication number 20130124109
- Publication date May 16, 2013
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
Performance Curve Generation For Non-Destructive Testing Sensors
- Publication number 20120271824
- Publication date Oct 25, 2012
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
97671188 - JETI
- Serial number 97671188
- Registration number 7382307
- Filing date Nov 10, 2022
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87764645 - YOGISPECTION
- Serial number 87764645
- Filing date Jan 22, 2018
- JENTEK Sensors, Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
87241626 - JET
- Serial number 87241626
- Registration number 5228004
- Filing date Nov 18, 2016
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85436065 - PIG-IT
- Serial number 85436065
- Filing date Sep 30, 2011
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85407963 - HYPERLATTICE
- Serial number 85407963
- Registration number 4605817
- Filing date Aug 26, 2011
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77673859 - IDED
- Serial number 77673859
- Registration number 4014294
- Filing date Feb 19, 2009
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77617667 - GRIDSTATION
- Serial number 77617667
- Registration number 3695044
- Filing date Nov 19, 2008
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76223698 - IDED
- Serial number 76223698
- Registration number 2515176
- Filing date Mar 13, 2001
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75495565 - GRIDSTATION
- Serial number 75495565
- Registration number 2466872
- Filing date Jun 3, 1998
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75495566 - MWM
- Serial number 75495566
- Registration number 2414984
- Filing date Jun 3, 1998
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75495564 - JENTEK
- Serial number 75495564
- Registration number 2414983
- Filing date Jun 3, 1998
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75356448 - SENSORTAPE
- Serial number 75356448
- Filing date Aug 25, 1997
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75071368 - MWM
- Serial number 75071368
- Filing date Mar 4, 1996
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75071361 - JENTEK
- Serial number 75071361
- Filing date Mar 4, 1996
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75071366 - GRIDSTATION
- Serial number 75071366
- Filing date Mar 4, 1996
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75071373 - JENTEK
- Serial number 75071373
- Registration number 2030351
- Filing date Mar 4, 1996
- JENTEK Sensors, Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
75071367 - JENTEK SENSORS
- Serial number 75071367
- Filing date Mar 4, 1996
- JENTEK Sensors, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

JENTEK SENSORS INC

Organization

Business Address

State Location

State of Incorporation

Patents Grantslast 30 patents

System and method for hole inspection

Method and apparatus for measurement of material condition

Measurement system and method of use

Segmented field eddy current sensing for dispersive property measur...

In-process quality assessment for additive manufacturing

Measurement system and method of use

In-process quality assessment for additive manufacturing

Complex part inspection with eddy current sensors

Segmented field eddy current sensing for dispersive property measur...

In-process quality assessment for additive manufacturing

Method and apparatus for measurement of material condition

Method and apparatus for inspection of corrosion and other defects...

Integrated sensor cartridge system and method of use

Method and apparatus for non-destructive evaluation of materials

Measurement system and method of use

Portable test instrument

Method and apparatus for measurement of material condition

Performance curve generation for non-destructive testing sensors

Method and apparatus for inspection of corrosion and other defects...

Method and apparatus for non-destructive evaluation of materials

Durability enhanced and redundant embedded sensors

Method and apparatus for inspection of corrosion and other defects...

Method and apparatus for load and additional property measurement

Internal material condition monitoring for control

Method and apparatus for detection and characterization of mechanic...

Method and apparatus for non-destructive evaluation of materials

Durability enhanced and redundant embedded sensors

Remaining life prediction for individual components from sparse data

Component adaptive life management

Method for stress assessment that removes temperature effects and h...

Patents Applicationslast 30 patents

Scanning System and Method for Axial Symmetric Test Objects

MEASUREMENT SYSTEM AND METHOD OF USE

In-Process Quality Assessment for Additive Manufacturing

MEASUREMENT SYSTEM AND METHOD OF USE

In-Process Quality Assessment for Additive Manufacturing

SEGMENTED FIELD EDDY CURRENT SENSING FOR DISPERSIVE PROPERTY MEASUR...

COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS

MEASUREMENT SYSTEM AND METHOD OF USE

SYSTEM AND METHOD FOR PIT DETECTION AND SIZING

SYSTEM AND METHOD FOR HOLE INSPECTION

SYSTEM AND METHOD FOR HOLE INSPECTION AND QUALIFICATION

In-Process Quality Assessment for Additive Manufacturing

Method and Apparatus for Measurement of Material Condition

MEASUREMENT SYSTEM AND METHOD OF USE

COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS

Segmented Field Eddy Current Sensing for Dispersive Property Measur...

Method and Apparatus for Measurement of Material Condition

IN SITU ADDITIVE MANUFACTURING PROCESS SENSING AND CONTROL INCLUDIN...

Method And Apparatus For Inspection Of Corrosion And Other Defects...

In-Process Quality Assessment for Additive Manufacturing

METHOD AND APPARATUS FOR NON-DESTRUCTIVE EVALUATION OF MATERIALS

INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USE

Method and Apparatus for Measurement of Material Condition

METHOD AND APPARATUS FOR INSPECTION OF CORROSION AND OTHER DEFECTS...

Method and Apparatus for Non-Destructive Evaluation of Materials

INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL

Durability Enhanced And Redundant Embedded Sensors

Method and Apparatus for Detection and Characterization of Mechanic...

Method and Apparatus for Inspection of Corrosion and Other Defects...

Performance Curve Generation For Non-Destructive Testing Sensors

Trademarklast 30 trademarks

97671188 - JETI

87764645 - YOGISPECTION

87241626 - JET

85436065 - PIG-IT

85407963 - HYPERLATTICE

77673859 - IDED

77617667 - GRIDSTATION

76223698 - IDED

75495565 - GRIDSTATION

75495566 - MWM

75495564 - JENTEK

75356448 - SENSORTAPE