JEOL Engineering Co., Ltd.

Organization

Tokyo, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for preparing samples
- Patent number 7,722,818
- Issue date May 25, 2010
- Jeol Ltd.
- Fuminori Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Mask and apparatus using it to prepare sample by ion milling
- Patent number 7,354,500
- Issue date Apr 8, 2008
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 6,968,043
- Issue date Nov 22, 2005
- Jeol Ltd.
- Masami Amemiya
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of producing ion sensitive film for ion sensor
- Patent number 6,855,747
- Issue date Feb 15, 2005
- Jeol Ltd.
- Tadashi Kawai
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for managing data
- Patent number 6,778,944
- Issue date Aug 17, 2004
- Jeol Ltd.
- Miyuki Kaneyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analytical method for electron microscopy
- Patent number 6,774,362
- Issue date Aug 10, 2004
- Jeol Ltd.
- Masumi Katagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,528,787
- Issue date Mar 4, 2003
- Jeol Ltd.
- Masumi Katagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal field emission electron gun
- Patent number 5,962,961
- Issue date Oct 5, 1999
- JEOL Ltd. and JEOL Engineering Co., Ltd.
- Iwao Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulse shaping circuit
- Patent number 5,576,658
- Issue date Nov 19, 1996
- Jeol Ltd.
- Kazuo Hushimi
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for preparing samples
- Publication number 20050118065
- Publication date Jun 2, 2005
- JEOL Ltd.
- Fuminori Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Mask and apparatus using it to prepare sample by ion milling
- Publication number 20050081997
- Publication date Apr 21, 2005
- JEOL Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
X-ray analyzer
- Publication number 20040136500
- Publication date Jul 15, 2004
- JEOL Ltd.
- Masami Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Method of producing ion sensitive film for ion sensor
- Publication number 20030166736
- Publication date Sep 4, 2003
- JEOL Ltd. and JEOL Engineering Co., Ltd.
- Tadashi Kawai
- G01 - MEASURING TESTING
Information Patent Application
Method and system for managing data
- Publication number 20030110010
- Publication date Jun 12, 2003
- JEOL Ltd.
- Miyuki Kaneyama
- G06 - COMPUTING CALCULATING COUNTING

JEOL Engineering Co., Ltd.

Organization

Patents Grantslast 30 patents

Apparatus and method for preparing samples

Mask and apparatus using it to prepare sample by ion milling

X-ray analyzer

Method of producing ion sensitive film for ion sensor

Method and system for managing data

Analytical method for electron microscopy

Scanning electron microscope

Thermal field emission electron gun

Pulse shaping circuit

Patents Applicationslast 30 patents

Apparatus and method for preparing samples

Mask and apparatus using it to prepare sample by ion milling

X-ray analyzer

Method of producing ion sensitive film for ion sensor

Method and system for managing data

Trademarklast 30 trademarks