Johannes Heidenhain GmbH

Organization

Traunreut, DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for synchronizing a control unit and at least one...
- Patent number 9,703,749
- Issue date Jul 11, 2017
- Johannes Heidenhain GmbH
- Robert Wastlhuber
- G05 - CONTROLLING REGULATING
Information Patent Grant
System having a plurality of scanning units of a position measuring...
- Patent number 8,842,295
- Issue date Sep 23, 2014
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Assembly comprising a measuring scale attached to a substrate and m...
- Patent number 8,650,769
- Issue date Feb 18, 2014
- Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Rotary encoder
- Patent number 7,896,552
- Issue date Mar 1, 2011
- Johannes Heidenhain GmbH
- Yoshiyuki Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring arrangement
- Patent number 7,461,464
- Issue date Dec 9, 2008
- Johannes Heidenhain, GmbH
- Rudolf Mittmann
- G01 - MEASURING TESTING
Information Patent Grant
Rotary encoder and method for its operation
- Patent number 7,439,734
- Issue date Oct 21, 2008
- Johannes Heidenhain GmbH
- Peter Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for regulating a light source of a position-measu...
- Patent number 7,235,776
- Issue date Jun 26, 2007
- Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Mounting aid for a position measuring system, as well as a scale an...
- Patent number 7,219,439
- Issue date May 22, 2007
- Johannes Heidenhain GmbH
- Markus Kühler
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device
- Patent number 7,196,319
- Issue date Mar 27, 2007
- Johannes Heidenhain GmbH
- Karsten Saendig
- G01 - MEASURING TESTING
Information Patent Grant
Interferential position measuring arrangement
- Patent number 7,154,609
- Issue date Dec 26, 2006
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
System for temperature monitoring
- Patent number 6,929,396
- Issue date Aug 16, 2005
- Johannes Heidenhain GmbH
- Franz Gramsamer
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system
- Patent number 6,826,847
- Issue date Dec 7, 2004
- Johannes Heidenhain GmbH
- Claudia Wahl
- G01 - MEASURING TESTING
Information Patent Grant
Control device of a position measuring system
- Patent number 6,807,499
- Issue date Oct 19, 2004
- Johannes Heidenhain GmbH
- Reiner Burgschat
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device and method for the start-up of a position...
- Patent number 6,801,874
- Issue date Oct 5, 2004
- Johannes Heidenhain GmbH
- Erich Strasser
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating an annular scale
- Patent number 6,775,921
- Issue date Aug 17, 2004
- Johannes Heidenhain GmbH
- Dieter Spark
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for generating command variables for control loops of a...
- Patent number 6,772,020
- Issue date Aug 3, 2004
- Johannes Heidenhain GmbH
- Frieder Kohler
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for monitoring the ground potential of a rectifier drive
- Patent number 6,747,458
- Issue date Jun 8, 2004
- Johannes Heidenhain GmbH
- Norbert Huber
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measurement system comprising an acceleration sensor and a position...
- Patent number 6,736,009
- Issue date May 18, 2004
- Johannes Heidenhain GmbH
- Michael Schwabe
- G01 - MEASURING TESTING
Information Patent Grant
Reflective measuring scale graduation and method for its manufacture
- Patent number 6,671,092
- Issue date Dec 30, 2003
- Johannes Heidenhain GmbH
- Georg Flatscher
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for generating a partially synthesized signal wit...
- Patent number 6,628,004
- Issue date Sep 30, 2003
- Johannes Heidenhain, GmbH
- Christa Boehringer
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Scanning head comprising a semiconductor substrate with a blind hol...
- Patent number 6,603,114
- Issue date Aug 5, 2003
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring device with a beam splitter
- Patent number 6,535,290
- Issue date Mar 18, 2003
- Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Numerical control unit with a spatially separated input device
- Patent number 6,507,760
- Issue date Jan 14, 2003
- Johannes Heidenhain GmbH
- Alfons Baumgartner
- G05 - CONTROLLING REGULATING
Information Patent Grant
Compact optical measuring module utilizing three dimensional constr...
- Patent number 6,476,380
- Issue date Nov 5, 2002
- Johannes Heidenhain GmbH
- Reiner Burgschat
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current sensor with a modification coil for reducing extensive...
- Patent number 6,462,535
- Issue date Oct 8, 2002
- Johannes Heidenhain GmbH
- Michael Schwabe
- G01 - MEASURING TESTING
Information Patent Grant
Angle measuring system and method for mounting an angle measuring s...
- Patent number 6,452,160
- Issue date Sep 17, 2002
- Johannes Heidenhain GmbH
- Johann Mitterreiter
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system
- Patent number 6,452,159
- Issue date Sep 17, 2002
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for reducing temperature-related dimensional...
- Patent number 6,446,350
- Issue date Sep 10, 2002
- Johannes Heidenhain GmbH
- Günther Nelle
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and arrangement for selecting safety parameters to be monitored
- Patent number 6,445,965
- Issue date Sep 3, 2002
- Johannes Heidenhain GmbH
- Gerhard Mühlbauer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Signal handling device
- Patent number 6,421,628
- Issue date Jul 16, 2002
- Johannes Heidenhain GmbH
- Ulf Thorsander
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
ANGLE MEASURING DEVICE
- Publication number 20210003379
- Publication date Jan 7, 2021
- JOHANNES HEIDENHAIN GmbH
- Johann Mitterreiter
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC DISTANCE MEASUREMENT DEVICE
- Publication number 20120242994
- Publication date Sep 27, 2012
- Johannes Heidenhain GmbH
- Walter Huber
- G01 - MEASURING TESTING
Information Patent Application
Optical position measuring arrangement
- Publication number 20090195792
- Publication date Aug 6, 2009
- Johannes Heidenhain GmbH
- Michael Hermann
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
73792012 - CONTEX
- Serial number 73792012
- Filing date Apr 7, 1989
- JOHANNES HEIDENHAIN GMBH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Johannes Heidenhain GmbH

Organization

Patents Grantslast 30 patents

Method and device for synchronizing a control unit and at least one...

System having a plurality of scanning units of a position measuring...

Assembly comprising a measuring scale attached to a substrate and m...

Rotary encoder

Position measuring arrangement

Rotary encoder and method for its operation

Method and device for regulating a light source of a position-measu...

Mounting aid for a position measuring system, as well as a scale an...

Position-measuring device

Interferential position measuring arrangement

System for temperature monitoring

Position measuring system

Control device of a position measuring system

Position measuring device and method for the start-up of a position...

Method for fabricating an annular scale

Arrangement for generating command variables for control loops of a...

Method for monitoring the ground potential of a rectifier drive

Measurement system comprising an acceleration sensor and a position...

Reflective measuring scale graduation and method for its manufacture

Device and method for generating a partially synthesized signal wit...

Scanning head comprising a semiconductor substrate with a blind hol...

Optical position measuring device with a beam splitter

Numerical control unit with a spatially separated input device

Compact optical measuring module utilizing three dimensional constr...

Eddy current sensor with a modification coil for reducing extensive...

Angle measuring system and method for mounting an angle measuring s...

Position measuring system

Method and arrangement for reducing temperature-related dimensional...

Method and arrangement for selecting safety parameters to be monitored

Signal handling device

Patents Applicationslast 30 patents

ANGLE MEASURING DEVICE

INTERFEROMETRIC DISTANCE MEASUREMENT DEVICE

Optical position measuring arrangement

Trademarklast 30 trademarks

73792012 - CONTEX