Jordan Valley Applied Radiation Ltd.

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Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Overlay metrology using X-rays
- Patent number 7,481,579
- Issue date Jan 27, 2009
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration of X-ray reflectometry system
- Patent number 7,474,732
- Issue date Jan 6, 2009
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Detection of dishing and tilting using X-ray fluorescence
- Patent number 7,245,695
- Issue date Jul 17, 2007
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Efficient measurement of diffuse X-ray reflections
- Patent number 7,231,016
- Issue date Jun 12, 2007
- Jordan Valley Applied Radiation, Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry of thin film layers with enhanced accuracy
- Patent number 7,130,376
- Issue date Oct 31, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Combined X-ray reflectometer and diffractometer
- Patent number 7,120,228
- Issue date Oct 10, 2006
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing resolution of X-ray measurements by sample motion
- Patent number 7,113,566
- Issue date Sep 26, 2006
- Jordan Valley Applied Radiation Ltd.
- Asher Peled
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimensions using X-ray diffraction in refle...
- Patent number 7,110,491
- Issue date Sep 19, 2006
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Material analysis using multiple X-ray reflectometry models
- Patent number 7,103,142
- Issue date Sep 5, 2006
- Jordan Valley Applied Radiation Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus with dual monochromators
- Patent number 7,076,024
- Issue date Jul 11, 2006
- Jordan Valley Applied Radiation, Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of X-ray reflectometry by measurement of diffuse reflec...
- Patent number 7,068,753
- Issue date Jun 27, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry of thin film layers with enhanced accuracy
- Patent number 7,062,013
- Issue date Jun 13, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scattering with a polychromatic source
- Patent number 7,035,375
- Issue date Apr 25, 2006
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Optical alignment of X-ray microanalyzers
- Patent number 7,023,954
- Issue date Apr 4, 2006
- Jordan Valley Applied Radiation Ltd.
- Tzachi Rafaeli
- G01 - MEASURING TESTING
Information Patent Grant
Beam centering and angle calibration for X-ray reflectometry
- Patent number 6,947,520
- Issue date Sep 20, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength x-ray monochromator
- Patent number 6,907,108
- Issue date Jun 14, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry with small-angle scattering measurement
- Patent number 6,895,075
- Issue date May 17, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength X-ray reflectometry
- Patent number 6,680,996
- Issue date Jan 20, 2004
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometer
- Patent number 6,639,968
- Issue date Oct 28, 2003
- Jordan Valley Applied Radiation, Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimensions using X-rays
- Patent number 6,556,652
- Issue date Apr 29, 2003
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed X-ray reflectometer
- Patent number 6,535,575
- Issue date Mar 18, 2003
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometer
- Patent number 6,512,814
- Issue date Jan 28, 2003
- Jordan Valley Applied Radiation
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Differential measurement of X-ray microfluorescence
- Patent number 6,453,002
- Issue date Sep 17, 2002
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray array detector
- Patent number 6,389,102
- Issue date May 14, 2002
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray microanalyzer for thin films
- Patent number 6,381,303
- Issue date Apr 30, 2002
- Jordan Valley Applied Radiation Ltd.
- Long Vu
- G01 - MEASURING TESTING
Information Patent Grant
Detection of voids in semiconductor wafer processing
- Patent number 6,351,516
- Issue date Feb 26, 2002
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Contamination and residuals inspection system
- Patent number 6,184,686
- Issue date Feb 6, 2001
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray microfluorescence analyzer
- Patent number 6,108,398
- Issue date Aug 22, 2000
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 6,041,095
- Issue date Mar 21, 2000
- Jordan Valley Applied Radiation
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Plasma spectrometer with shutter assembly
- Patent number 5,946,089
- Issue date Aug 31, 1999
- Jordan Valley Applied Radiation Ltd.
- Reuven Duer
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Measurement of critical dimensions using X-ray diffraction in refle...
- Publication number 20060133570
- Publication date Jun 22, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Multifunction X-ray analysis system
- Publication number 20060062351
- Publication date Mar 23, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Optical alignment of X-ray microanalyzers
- Publication number 20050069090
- Publication date Mar 31, 2005
- JORDAN VALLEY APPLIED RADIATION LTD.
- Tzachi Rafaeli
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometry with small-angle scattering measurement
- Publication number 20040156474
- Publication date Aug 12, 2004
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Dual-wavelength X-ray reflectometry
- Publication number 20030156682
- Publication date Aug 21, 2003
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
78455277 - MUL-T-PASS
- Serial number 78455277
- Registration number 3230629
- Filing date Jul 22, 2004
- Jordan Valley Applied Radiation Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78455256 - JVX
- Serial number 78455256
- Registration number 3027570
- Filing date Jul 22, 2004
- Jordan Valley Applied Radiation Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Jordan Valley Applied Radiation Ltd.

Organization

Patents Grantslast 30 patents

Overlay metrology using X-rays

Calibration of X-ray reflectometry system

Detection of dishing and tilting using X-ray fluorescence

Efficient measurement of diffuse X-ray reflections

X-ray reflectometry of thin film layers with enhanced accuracy

Combined X-ray reflectometer and diffractometer

Enhancing resolution of X-ray measurements by sample motion

Measurement of critical dimensions using X-ray diffraction in refle...

Material analysis using multiple X-ray reflectometry models

X-ray apparatus with dual monochromators

Enhancement of X-ray reflectometry by measurement of diffuse reflec...

X-ray reflectometry of thin film layers with enhanced accuracy

X-ray scattering with a polychromatic source

Optical alignment of X-ray microanalyzers

Beam centering and angle calibration for X-ray reflectometry

Dual-wavelength x-ray monochromator

X-ray reflectometry with small-angle scattering measurement

Dual-wavelength X-ray reflectometry

X-ray reflectometer

Measurement of critical dimensions using X-rays

Pulsed X-ray reflectometer

X-ray reflectometer

Differential measurement of X-ray microfluorescence

X-ray array detector

X-ray microanalyzer for thin films

Detection of voids in semiconductor wafer processing

Contamination and residuals inspection system

X-ray microfluorescence analyzer

X-ray fluorescence analyzer

Plasma spectrometer with shutter assembly

Patents Applicationslast 30 patents

Measurement of critical dimensions using X-ray diffraction in refle...

Multifunction X-ray analysis system

Optical alignment of X-ray microanalyzers

X-ray reflectometry with small-angle scattering measurement

Dual-wavelength X-ray reflectometry

Trademarklast 30 trademarks

78455277 - MUL-T-PASS

78455256 - JVX