JORDAN VALLEY SEMICONDUCTORS LTD

Organization

MIGDAL HAEMEK, IM

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
X-ray beam conditioning
- Patent number 9,269,468
- Issue date Feb 23, 2016
- Jordan Valley Semiconductors Ltd.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
Optical vacuum ultra-violet wavelength nanoimprint metrology
- Patent number 8,867,041
- Issue date Oct 21, 2014
- Jordan Valley Semiconductor Ltd
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Detection of wafer-edge defects
- Patent number 8,781,070
- Issue date Jul 15, 2014
- Jordan Valley Semiconductors Ltd.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,731,138
- Issue date May 20, 2014
- Jordan Valley Semiconductor Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector assembly with shield
- Patent number 8,693,635
- Issue date Apr 8, 2014
- Jordan Valley Semiconductor Ltd.
- Alexander Krohmal
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing accuracy of fast high-resolution X-ray diffractometry
- Patent number 8,687,766
- Issue date Apr 1, 2014
- Jordan Valley Semiconductors Ltd.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Combining X-ray and VUV analysis of thin film layers
- Patent number 8,565,379
- Issue date Oct 22, 2013
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for using reflectometry below deep ultra-violet (...
- Patent number 8,564,780
- Issue date Oct 22, 2013
- Jordan Valley Semiconductors Ltd.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Fast measurement of X-ray diffraction from tilted layers
- Patent number 8,437,450
- Issue date May 7, 2013
- Jordan Valley Semiconductors Ltd.
- John Wall
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,243,878
- Issue date Aug 14, 2012
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Automated calibration methodology for VUV metrology system
- Patent number 8,153,987
- Issue date Apr 10, 2012
- Jordan Valley Semiconductors Ltd.
- Jeffrey B. Hurst
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accurate calibration of VUV reflectometer
- Patent number 8,119,991
- Issue date Feb 21, 2012
- Jordan Valley Semiconductors Ltd.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Broad band referencing reflectometer
- Patent number 8,054,453
- Issue date Nov 8, 2011
- Jordan Valley Semiconductors Ltd.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Broad band referencing reflectometer
- Patent number 8,014,000
- Issue date Sep 6, 2011
- Jordan Valley Semiconductors Ltd.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optically measuring periodic structures us...
- Patent number 7,990,549
- Issue date Aug 2, 2011
- Jordan Valley Semiconductors Ltd.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for using multiple relative reflectance measur...
- Patent number 7,948,631
- Issue date May 24, 2011
- Jordan Valley Semiconductors Ltd.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accurate calibration of VUV reflectometer
- Patent number 7,804,059
- Issue date Sep 28, 2010
- Jordan Valley Semiconductors Ltd.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Accurate measurement of layer dimensions using XRF
- Patent number 7,804,934
- Issue date Sep 28, 2010
- Jordan Valley Semiconductors Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Grant
X-ray measurement of properties of nano-particles
- Patent number 7,680,243
- Issue date Mar 16, 2010
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of small features using X-ray fluorescence
- Patent number 7,653,174
- Issue date Jan 26, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Automated selection of X-ray reflectometry measurement locations
- Patent number 7,649,978
- Issue date Jan 19, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Target alignment for X-ray scattering measurements
- Patent number 7,600,916
- Issue date Oct 13, 2009
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of properties of thin films on sidewalls
- Patent number 7,483,513
- Issue date Jan 27, 2009
- Jordan Valley Semiconductors, Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Control of X-ray beam spot size
- Patent number 7,453,985
- Issue date Nov 18, 2008
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Curved X-ray reflector
- Patent number 7,415,096
- Issue date Aug 19, 2008
- Jordan Valley Semiconductors Ltd.
- Dov Sherman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Control of X-ray beam spot size
- Patent number 7,406,153
- Issue date Jul 29, 2008
- Jordan Valley Semiconductors Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Multi-detector EDXRD
- Patent number 7,321,652
- Issue date Jan 22, 2008
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT OF SMALL FEATURES USING XRF
- Publication number 20160123909
- Publication date May 5, 2016
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
USING MULTIPLE SOURCES/DETECTORS FOR HIGH-THROUGHPUT X-RAY TOPOGRAP...
- Publication number 20150369761
- Publication date Dec 24, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCATTEROMETRY APPARATUS
- Publication number 20150369759
- Publication date Dec 24, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL CO...
- Publication number 20150330921
- Publication date Nov 19, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE ASSEMBLY
- Publication number 20150243469
- Publication date Aug 27, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)
- Publication number 20150204806
- Publication date Jul 23, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS
- Publication number 20140286473
- Publication date Sep 25, 2014
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Alex Tokar
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM CONDITIONING
- Publication number 20130287178
- Publication date Oct 31, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Application
X-ray inspection of bumps on a semiconductor substrate
- Publication number 20130089178
- Publication date Apr 11, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection of Wafer-Edge Defects
- Publication number 20130039471
- Publication date Feb 14, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20120281814
- Publication date Nov 8, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Combining X-ray and VUV Analysis of Thin Film Layers
- Publication number 20120275568
- Publication date Nov 1, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Optical Vacuum Ultra-Violet Wavelength Nanoimprint Metrology
- Publication number 20120182542
- Publication date Jul 19, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
- Publication number 20120140889
- Publication date Jun 7, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- John Wall
- G01 - MEASURING TESTING
Information Patent Application
ENHANCING ACCURACY OF FAST HIGH-RESOLUTION X-RAY DIFFRACTOMETRY
- Publication number 20120014508
- Publication date Jan 19, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20110164730
- Publication date Jul 7, 2011
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
BROAD BAND REFERENCING REFLECTOMETER
- Publication number 20100328648
- Publication date Dec 30, 2010
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Accurate Calibration of VUV Reflectometer
- Publication number 20100301225
- Publication date Dec 2, 2010
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Using Reflectometry Below Deep Ultra-Violet (...
- Publication number 20100290033
- Publication date Nov 18, 2010
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
COMBINED OPTICAL METROLOGY TECHNIQUES
- Publication number 20100277741
- Publication date Nov 4, 2010
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF
- Publication number 20090074137
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
X-ray measurement of properties of nano-particles
- Publication number 20090067573
- Publication date Mar 12, 2009
- JORDAN VALLEY SEMICONDUCTORS
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Inspection of small features using X-Ray fluorescence
- Publication number 20080159475
- Publication date Jul 3, 2008
- JORDAN VALLEY SEMICONDUCTORS
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Control of X-ray beam spot size
- Publication number 20080043911
- Publication date Feb 21, 2008
- Jordan Valley Semiconductors Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
Control of X-ray beam spot size
- Publication number 20080043914
- Publication date Feb 21, 2008
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Curved X-ray reflector
- Publication number 20070025511
- Publication date Feb 1, 2007
- Jordan Valley Semiconductors Ltd.
- Dov Sherman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

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Trademarklast 30 trademarks

Information Trademark
79117503 - JORDAN VALLEY
- Serial number 79117503
- Registration number 4348580
- Filing date May 22, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77176625 - XCD
- Serial number 77176625
- Registration number 4031825
- Filing date May 9, 2007
- JORDAN VALLEY SEMICONDUCTORS LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77176687 - XOL
- Serial number 77176687
- Registration number 4031826
- Filing date May 9, 2007
- JORDAN VALLEY SEMICONDUCTORS LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

JORDAN VALLEY SEMICONDUCTORS LTD

Organization

Patents Grantslast 30 patents

X-ray beam conditioning

Optical vacuum ultra-violet wavelength nanoimprint metrology

Detection of wafer-edge defects

High-resolution X-ray diffraction measurement with enhanced sensiti...

X-ray detector assembly with shield

Enhancing accuracy of fast high-resolution X-ray diffractometry

Combining X-ray and VUV analysis of thin film layers

Method and system for using reflectometry below deep ultra-violet (...

Fast measurement of X-ray diffraction from tilted layers

High-resolution X-ray diffraction measurement with enhanced sensiti...

Automated calibration methodology for VUV metrology system

Method and apparatus for accurate calibration of VUV reflectometer

Broad band referencing reflectometer

Broad band referencing reflectometer

Method and apparatus for optically measuring periodic structures us...

Method and apparatus for using multiple relative reflectance measur...

Method and apparatus for accurate calibration of VUV reflectometer

Accurate measurement of layer dimensions using XRF

X-ray measurement of properties of nano-particles

Inspection of small features using X-ray fluorescence

Automated selection of X-ray reflectometry measurement locations

Target alignment for X-ray scattering measurements

Measurement of properties of thin films on sidewalls

Control of X-ray beam spot size

Curved X-ray reflector

Control of X-ray beam spot size

Multi-detector EDXRD

Patents Applicationslast 30 patents

MEASUREMENT OF SMALL FEATURES USING XRF

USING MULTIPLE SOURCES/DETECTORS FOR HIGH-THROUGHPUT X-RAY TOPOGRAP...

X-RAY SCATTEROMETRY APPARATUS

METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL CO...

X-RAY SOURCE ASSEMBLY

ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)

ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS

X-RAY BEAM CONDITIONING

X-ray inspection of bumps on a semiconductor substrate

Detection of Wafer-Edge Defects

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

Combining X-ray and VUV Analysis of Thin Film Layers

Optical Vacuum Ultra-Violet Wavelength Nanoimprint Metrology

FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS

ENHANCING ACCURACY OF FAST HIGH-RESOLUTION X-RAY DIFFRACTOMETRY

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

BROAD BAND REFERENCING REFLECTOMETER

Method and Apparatus for Accurate Calibration of VUV Reflectometer

Method and System for Using Reflectometry Below Deep Ultra-Violet (...

COMBINED OPTICAL METROLOGY TECHNIQUES

Automated selection of x-ray reflectometry measurement locations

ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF

X-ray measurement of properties of nano-particles

Inspection of small features using X-Ray fluorescence

Control of X-ray beam spot size

Control of X-ray beam spot size

Curved X-ray reflector

Trademarklast 30 trademarks

79117503 - JORDAN VALLEY

77176625 - XCD

77176687 - XOL