JPK INSTRUMENTS AG

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12099 BERLIN, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and a method for investigating a sample by means of sever...
- Patent number 9,080,937
- Issue date Jul 14, 2015
- JPK Instruments AG
- Gerd Behme
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for examining a specimen by means of probe mic...
- Patent number 9,063,335
- Issue date Jun 23, 2015
- JPK Instruments AG
- Gunnar Sommer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for determining the cell activation of a targe...
- Patent number 9,018,018
- Issue date Apr 28, 2015
- JPK Instruments AG
- Matthias Amrein
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for the combined analysis of a sample with obj...
- Patent number 8,898,809
- Issue date Nov 25, 2014
- JPK Instruments AG
- Torsten Müller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for examining a measurement object, and apparatus
- Patent number 8,769,711
- Issue date Jul 1, 2014
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for receiving a test sample
- Patent number 8,506,909
- Issue date Aug 13, 2013
- JPK Instruments AG
- Olaf Sünwoldt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring probe device for a probe microscope, measuring cell and s...
- Patent number 8,505,109
- Issue date Aug 6, 2013
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for characterizing a sample with two or more o...
- Patent number 8,415,613
- Issue date Apr 9, 2013
- JPK Instruments AG
- Sven-Peter Heyn
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for examining a test sample using a scanning probe microscop...
- Patent number 8,381,311
- Issue date Feb 19, 2013
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for the operation of a measurement system with a scanning pr...
- Patent number 8,368,017
- Issue date Feb 5, 2013
- JPK Instruments AG
- Torsten Jahnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for providing a probe for a probe-microscopic analysis of a...
- Patent number 7,971,266
- Issue date Jun 28, 2011
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and a device for the positioning of a displaceable component...
- Patent number 7,934,323
- Issue date May 3, 2011
- JPK Instruments AG
- Detlef Knebel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,473,894
- Issue date Jan 6, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Method for locally highly resolved, mass-spectroscopic characteriza...
- Patent number 7,442,922
- Issue date Oct 28, 2008
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to study a surfactant
- Patent number 7,155,962
- Issue date Jan 2, 2007
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Probe mounting device for a scanning probe microscope
- Patent number 7,114,405
- Issue date Oct 3, 2006
- JPK Instruments AG
- Olaf Sünwoldt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,022,985
- Issue date Apr 4, 2006
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Method of and an apparatus for measuring a specimen by means of a s...
- Patent number 6,998,602
- Issue date Feb 14, 2006
- JPK Instruments AG
- Jörn Kamps
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Device for Examining a Sample with a Probe Microscope
- Publication number 20110302676
- Publication date Dec 8, 2011
- JPK INSTRUMENTS AG
- Jacob Kerssemakers
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Characterizing a Sample with Two or More O...
- Publication number 20100251437
- Publication date Sep 30, 2010
- JPK INSTRUMENTS AG
- Sven-Peter Heyn
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR EXAMINING A SPECIMEN BY MEANS OF PROBE MIC...
- Publication number 20100229262
- Publication date Sep 9, 2010
- JPK INSTRUMENTS AG
- Gunnar Sommer
- G02 - OPTICS
Information Patent Application
METHOD FOR EXAMINING A TEST SAMPLE USING A SCANNING PROBE MICRSCOPE...
- Publication number 20100218284
- Publication date Aug 26, 2010
- JPK INSTRUMENTS AG
- Torsten Jahnke
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Positioning a Movable Part in a Test System
- Publication number 20090140685
- Publication date Jun 4, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
86170063 - CELLHESION
- Serial number 86170063
- Registration number 4588478
- Filing date Jan 20, 2014
- JPK Instruments AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79040129 - JPK INSTRUMENTS
- Serial number 79040129
- Registration number 3472474
- Filing date May 21, 2007
- JPK Instruments AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79042680 - NANOVERSE
- Serial number 79042680
- Registration number 3436454
- Filing date May 7, 2007
- JPK Instruments AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79003472 - CELLHESION
- Serial number 79003472
- Registration number 3041907
- Filing date May 6, 2004
- JPK Instruments AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79003494 - CELLWIZARD
- Serial number 79003494
- Registration number 3038113
- Filing date May 6, 2004
- JPK Instruments AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

JPK INSTRUMENTS AG

Organization

Patents Grantslast 30 patents

Apparatus and a method for investigating a sample by means of sever...

Apparatus and method for examining a specimen by means of probe mic...

Method and apparatus for determining the cell activation of a targe...

Method and apparatus for the combined analysis of a sample with obj...

Method for examining a measurement object, and apparatus

Device for receiving a test sample

Measuring probe device for a probe microscope, measuring cell and s...

Method and apparatus for characterizing a sample with two or more o...

Method for examining a test sample using a scanning probe microscop...

Method for the operation of a measurement system with a scanning pr...

Method for providing a probe for a probe-microscopic analysis of a...

Method and a device for the positioning of a displaceable component...

Apparatus and method for a scanning probe microscope

Method for locally highly resolved, mass-spectroscopic characteriza...

Method and apparatus to study a surfactant

Probe mounting device for a scanning probe microscope

Apparatus and method for a scanning probe microscope

Method of and an apparatus for measuring a specimen by means of a s...

Patents Applicationslast 30 patents

Method and Device for Examining a Sample with a Probe Microscope

Method and Apparatus for Characterizing a Sample with Two or More O...

APPARATUS AND METHOD FOR EXAMINING A SPECIMEN BY MEANS OF PROBE MIC...

METHOD FOR EXAMINING A TEST SAMPLE USING A SCANNING PROBE MICRSCOPE...

Method and Device for Positioning a Movable Part in a Test System

Trademarklast 30 trademarks

86170063 - CELLHESION

79040129 - JPK INSTRUMENTS

79042680 - NANOVERSE

79003472 - CELLHESION

79003494 - CELLWIZARD