JZW LLC

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Interferometric defect detection and classification
- Patent number 7,986,412
- Issue date Jul 26, 2011
- JZW LLC
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric defect detection
- Patent number 7,864,334
- Issue date Jan 4, 2011
- JZW LLC
- Hwan J. Jeong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC DEFECT DETECTION AND CLASSIFICATION
- Publication number 20110075151
- Publication date Mar 31, 2011
- JZW LLC
- Hwan J. JEONG
- G01 - MEASURING TESTING

Trademarklast 30 trademarks