Kabushiki Kaisha Akashi Seisakusho

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope or similar equipment with tiltable mic...
- Patent number 4,460,827
- Issue date Jul 17, 1984
- Kabushiki Kaisha Akashi Seisakusho
- Akira Onoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope or similar equipment
- Patent number 4,437,009
- Issue date Mar 13, 1984
- Kabushiki Kaisha Akashi Seisakusho
- Shigetomo Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope or similar equipment capable of displa...
- Patent number 4,420,686
- Issue date Dec 13, 1983
- Kabushiki Kaisha Akashi Seisakusho
- Akira Onoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hydraulic vibration tester
- Patent number 4,403,511
- Issue date Sep 13, 1983
- Kabushiki Kaisha Akashi Seisakusho
- Makoto Shibano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for correcting astigmatism in scanning electro...
- Patent number 4,321,468
- Issue date Mar 23, 1982
- Kabushiki Kaisha Akashi Seisakusho
- Takashi Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron lens
- Patent number 4,209,702
- Issue date Jun 24, 1980
- Kabushiki Kaisha Akashi Seisakusho
- Shogo Shirai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Reference-load variable hardness tester
- Patent number 4,136,555
- Issue date Jan 30, 1979
- Kabushiki Kaisha Akashi Seisakusho
- Shozo Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Microtome
- Patent number 4,126,069
- Issue date Nov 21, 1978
- Kabushiki Kaisha Akashi Seisakusho
- Tomoo Shimonaka
- G01 - MEASURING TESTING
Information Patent Grant
Loading shaft positioning apparatus for hardness tester
- Patent number 4,118,975
- Issue date Oct 10, 1978
- Kabushiki Kaisha Akashi Seisakusho
- Shozo Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Hardness tester
- Patent number 4,019,376
- Issue date Apr 26, 1977
- Kabushiki Kaisha Akashi Seisakusho
- Shozo Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Shock-absorbing mechanism for dial gage
- Patent number 4,010,548
- Issue date Mar 8, 1977
- Kabushiki Kaisha Akashi Seisakusho
- Shozo Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Load application mechanism of Rockwell hardness tester
- Patent number 3,949,600
- Issue date Apr 13, 1976
- Kabushiki Kaisha Akashi Seisakusho
- Shozo Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope specimen mounting apparatus
- Patent number 3,939,353
- Issue date Feb 17, 1976
- Kabushiki Kaisha Akashi Seisakusho
- Shogo Shirai
- H01 - BASIC ELECTRIC ELEMENTS

Kabushiki Kaisha Akashi Seisakusho

Organization

Patents Grantslast 30 patents

Scanning electron microscope or similar equipment with tiltable mic...

Scanning electron microscope or similar equipment

Scanning electron microscope or similar equipment capable of displa...

Hydraulic vibration tester

Method and apparatus for correcting astigmatism in scanning electro...

Multiple electron lens

Reference-load variable hardness tester

Microtome

Loading shaft positioning apparatus for hardness tester

Hardness tester

Shock-absorbing mechanism for dial gage

Load application mechanism of Rockwell hardness tester

Electron microscope specimen mounting apparatus