KIYOTA MANUFACTURING CO.

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Patents Grantslast 30 patents

Information Patent Grant
Contact probe, measuring pad used for the contact probe, and method...
- Patent number 7,227,352
- Issue date Jun 5, 2007
- National Institute of Advanced Industrial Science and Technology
- Masahiro Aoyagi
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe, measuring pad used for the contact probe, and method...
- Patent number 7,208,966
- Issue date Apr 24, 2007
- National Institute of Advanced Industrial Science and Technology
- Masahiro Aoyagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MAKING CONTACT PROBE
- Publication number 20110247209
- Publication date Oct 13, 2011
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Masahiro Aoyagi
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROVE AND METHOD OF MAKING THE SAME
- Publication number 20090224781
- Publication date Sep 10, 2009
- SHINWA FRONTECH CORP.
- Masahiro Aoyagi
- G01 - MEASURING TESTING
Information Patent Application
Contact probe, measuring pad used for the contact probe, and method...
- Publication number 20070065956
- Publication date Mar 22, 2007
- NAT'L INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Masahiro Aoyagi
- G01 - MEASURING TESTING
Information Patent Application
Contact probe, measuring pad used for the contact probe, and method...
- Publication number 20050264313
- Publication date Dec 1, 2005
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Masahiro Aoyagi
- G01 - MEASURING TESTING

Trademarklast 30 trademarks