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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of making contact probe
Patent number
9,134,346
Issue date
Sep 15, 2015
National Institute of Advanced Industrial Science and Technology
Masahiro Aoyagi
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and method of making the same
Patent number
7,990,165
Issue date
Aug 2, 2011
National Institute of Advanced Industrial Science and Technology
Masahiro Aoyagi
G01 - MEASURING TESTING
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