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Patents Grants
last 30 patents
Information
Patent Grant
Method for calibrating parameter of articulated coordinate measurin...
Patent number
8,468,869
Issue date
Jun 25, 2013
Kosaka Laboratory Ltd.
Fumikazu Ebara
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring coordinate using multi-joint arm
Patent number
7,051,447
Issue date
May 30, 2006
Kosaka Laboratory Ltd.
Akira Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method of measurement by scanning tunneling microscope
Patent number
4,902,892
Issue date
Feb 20, 1990
Agency of Industrial Science and Technology, Kosaka Laboratory Ltd.
Shigeo Okayama
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and apparatus for determining the location of points on a th...
Patent number
4,430,796
Issue date
Feb 14, 1984
Kosaka Laboratory Ltd.
Haruki Nakagawa
G01 - MEASURING TESTING
Information
Patent Grant
Three dimensional coordinate measuring apparatus
Patent number
4,384,407
Issue date
May 24, 1983
Kosaka Laboratory Ltd.
Kozo Miyamoto
G01 - MEASURING TESTING