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K&S Interconnect, Inc.
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Gilbert, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
See-saw interconnect assembly with dielectric carrier grid providin...
Patent number
7,059,865
Issue date
Jun 13, 2006
K&S Interconnect, Inc.
January Kister
G01 - MEASURING TESTING
Information
Patent Grant
Prefabricated and attached interconnect structure
Patent number
6,965,245
Issue date
Nov 15, 2005
K&S Interconnect, Inc.
January Kister
G01 - MEASURING TESTING
Information
Patent Grant
Continuously profiled probe beam
Patent number
D510043
Issue date
Sep 27, 2005
K&S Interconnect, Inc.
January Kister
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Straight protruding probe beam contour surfaces
Patent number
D507198
Issue date
Jul 12, 2005
K&S Interconnect, Inc.
January Kister
D10 - Measuring, testing, or signalling instruments
Patents Applications
last 30 patents
Information
Patent Application
Probe card assembly with dielectric structure
Publication number
20060250150
Publication date
Nov 9, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Probe card assembly and method of attaching probes to the probe car...
Publication number
20060181292
Publication date
Aug 17, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Method of shaping lithographically-produced probe elements
Publication number
20060119376
Publication date
Jun 8, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Stacked tip cantilever electrical connector
Publication number
20060043995
Publication date
Mar 2, 2006
K&S Interconnect, Inc.
Scott R. Williams
G01 - MEASURING TESTING
Information
Patent Application
Interconnect assembly for a probe card
Publication number
20060035485
Publication date
Feb 16, 2006
K&S Interconnect, Inc.
Jim Jaquette
G01 - MEASURING TESTING
Information
Patent Application
Probe tip plating
Publication number
20060027747
Publication date
Feb 9, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Reinforced probes for testing semiconductor devices
Publication number
20060028220
Publication date
Feb 9, 2006
K&S Interconnect, Inc.
Edward L. Malantonio
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for producing co-planar bonding pads on a subs...
Publication number
20060022690
Publication date
Feb 2, 2006
K&S Interconnect, Inc.
Edward L. Malantonio
G01 - MEASURING TESTING
Information
Patent Application
Method of probe tip shaping and cleaning
Publication number
20050260937
Publication date
Nov 24, 2005
K&S Interconnect, Inc.
Bahadir Tunaboylu
B24 - GRINDING POLISHING
Trademark
last 30 trademarks