Laser Precision Corporation

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Irvine, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining the distance to a reflective e...
- Patent number 5,500,730
- Issue date Mar 19, 1996
- Laser Precision Corp.
- Robert W. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting breaks in multi-drop feeder systems
- Patent number 5,335,104
- Issue date Aug 2, 1994
- Laser Precision Corp.
- Robert W. Johnson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Macrobend splice loss tester for fiber optic splices with silicon g...
- Patent number 5,315,365
- Issue date May 24, 1994
- Laser Precision Corp.
- Hosain Hakimi
- G02 - OPTICS
Information Patent Grant
Adjustable attenuator for optical transmission system
- Patent number 5,087,122
- Issue date Feb 11, 1992
- Laser Precision Corporation
- Frederick M. Ostrander
- G02 - OPTICS
Information Patent Grant
Reflectance infrared microscope having high radiation throughput
- Patent number 5,011,243
- Issue date Apr 30, 1991
- Laser Precision Corporation
- Walter M. Doyle
- G02 - OPTICS
Information Patent Grant
Signal averaging for optical time domain relectometers
- Patent number 4,928,232
- Issue date May 22, 1990
- Laser Precision Corporation
- John R. Gentile
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer system having interconnected computers at multiple opt...
- Patent number 4,888,714
- Issue date Dec 19, 1989
- Laser Precision Corporation
- Larry A. Dingle
- G01 - MEASURING TESTING
Information Patent Grant
Remotely controlled optical time domain reflectometer serving a plu...
- Patent number 4,875,772
- Issue date Oct 24, 1989
- Laser Precision Corporation
- John R. Gentile
- G01 - MEASURING TESTING
Information Patent Grant
Microscope for use in modular FTIR spectrometer system
- Patent number 4,852,955
- Issue date Aug 1, 1989
- Laser Precision Corporation
- Walter M. Doyle
- G02 - OPTICS
Information Patent Grant
Infrared microscope employing a projected field stop
- Patent number 4,843,242
- Issue date Jun 27, 1989
- Laser Precision Corporation
- Walter M. Doyle
- G02 - OPTICS
Information Patent Grant
Internal reflection spectroscopy for deep container immersion
- Patent number 4,835,389
- Issue date May 30, 1989
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Parabolic focusing apparatus for optical spectroscopy
- Patent number RE32912
- Issue date Apr 25, 1989
- Laser Precision Corporation
- Walter M. Doyle
- 356 - Optics: measuring and testing
Information Patent Grant
Spectrometer system having pivotally mounted internal reflectance e...
- Patent number 4,812,041
- Issue date Mar 14, 1989
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Sample transfer for infrared analysis in thin layer chromatography-...
- Patent number 4,812,241
- Issue date Mar 14, 1989
- Laser Precision Corporation
- Kenneth H. Shafer
- G01 - MEASURING TESTING
Information Patent Grant
Versatile and efficient radiation transmission apparatus and method...
- Patent number 4,810,093
- Issue date Mar 7, 1989
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Modular radiation transmission apparatus for spectrometers
- Patent number 4,784,488
- Issue date Nov 15, 1988
- Laser Precision Corporation
- Walter M. Doyle
- G02 - OPTICS
Information Patent Grant
High resolution spectrometer interferometer having an integrated al...
- Patent number 4,773,757
- Issue date Sep 27, 1988
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for spectral analysis of chromatographic fractions
- Patent number 4,764,676
- Issue date Aug 16, 1988
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Microscope accessory which facilitates radiation transmission measu...
- Patent number 4,758,088
- Issue date Jul 19, 1988
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
High efficiency radiation source for infrared spectrometry
- Patent number 4,724,329
- Issue date Feb 9, 1988
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Universal spectrometer system having modular sampling chamber
- Patent number 4,657,390
- Issue date Apr 14, 1987
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometers having purge retention during sample loading
- Patent number 4,640,617
- Issue date Feb 3, 1987
- Laser Precision Corporation
- Norman S. Hughes
- G01 - MEASURING TESTING
Information Patent Grant
Parabolic focusing apparatus for optical spectroscopy
- Patent number 4,591,266
- Issue date May 27, 1986
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer spectrometer having simplified scanning motion control
- Patent number 4,556,316
- Issue date Dec 3, 1985
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Alignment apparatus and method for interferometer spectrometers
- Patent number 4,544,272
- Issue date Oct 1, 1985
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Dual beam fourier spectrometer
- Patent number 4,538,910
- Issue date Sep 3, 1985
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer spectrometer having improved scanning reference point
- Patent number 4,537,508
- Issue date Aug 27, 1985
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Parabolic focusing apparatus for optical spectroscopy
- Patent number 4,473,295
- Issue date Sep 25, 1984
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Refractively scanned interferometer
- Patent number 4,286,877
- Issue date Sep 1, 1981
- Laser Precision Corporation
- William L. Clarke
- G01 - MEASURING TESTING
Information Patent Grant
Refractively scanned interferometer
- Patent number 4,265,540
- Issue date May 5, 1981
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

Information Trademark
73353180 - ANALECT
- Serial number 73353180
- Registration number 1255168
- Filing date Mar 5, 1982
- Laser Precision Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Laser Precision Corporation

Organization

Patents Grantslast 30 patents

Method and apparatus for determining the distance to a reflective e...

Method of detecting breaks in multi-drop feeder systems

Macrobend splice loss tester for fiber optic splices with silicon g...

Adjustable attenuator for optical transmission system

Reflectance infrared microscope having high radiation throughput

Signal averaging for optical time domain relectometers

Spectrometer system having interconnected computers at multiple opt...

Remotely controlled optical time domain reflectometer serving a plu...

Microscope for use in modular FTIR spectrometer system

Infrared microscope employing a projected field stop

Internal reflection spectroscopy for deep container immersion

Parabolic focusing apparatus for optical spectroscopy

Spectrometer system having pivotally mounted internal reflectance e...

Sample transfer for infrared analysis in thin layer chromatography-...

Versatile and efficient radiation transmission apparatus and method...

Modular radiation transmission apparatus for spectrometers

High resolution spectrometer interferometer having an integrated al...

Apparatus for spectral analysis of chromatographic fractions

Microscope accessory which facilitates radiation transmission measu...

High efficiency radiation source for infrared spectrometry

Universal spectrometer system having modular sampling chamber

Spectrometers having purge retention during sample loading

Parabolic focusing apparatus for optical spectroscopy

Interferometer spectrometer having simplified scanning motion control

Alignment apparatus and method for interferometer spectrometers

Dual beam fourier spectrometer

Interferometer spectrometer having improved scanning reference point

Parabolic focusing apparatus for optical spectroscopy

Refractively scanned interferometer

Refractively scanned interferometer

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

73353180 - ANALECT