LayTec Gesellschaft fuer in-situ und Nano-Sensorik mbH

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Berlin, DE

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Information Patent Application
Device and Method for the Measurement of the Curvature of a Surface
- Publication number 20070030493
- Publication date Feb 8, 2007
- LayTec Gesellschaft fuer in-situ und Nano-Sensorik mbH
- Thomas Zettler
- G01 - MEASURING TESTING

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